{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T09:22:41Z","timestamp":1725614561160},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/dft.2015.7315166","type":"proceedings-article","created":{"date-parts":[[2015,11,9]],"date-time":"2015-11-09T17:49:30Z","timestamp":1447091370000},"page":"221-226","source":"Crossref","is-referenced-by-count":2,"title":["A non-conservative software-based approach for detecting illegal CFEs caused by transient faults"],"prefix":"10.1109","author":[{"given":"Diego","family":"Rodrigues","sequence":"first","affiliation":[]},{"given":"Ghazaleh","family":"Nazarian","sequence":"additional","affiliation":[]},{"given":"Alvaro","family":"Moreira","sequence":"additional","affiliation":[]},{"given":"Luigi","family":"Carro","sequence":"additional","affiliation":[]},{"given":"Georgi","family":"Gaydadjiev","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1145\/2491899.2465568"},{"key":"ref3","first-page":"3","article-title":"Mibench: A free, commercially representative embedded benchmark suite","author":"guthaus","year":"2001","journal-title":"IEEE International Workshop on Workload Characterization"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/EDCC.2014.30"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/24.994913"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/OLT.2003.1214380"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TC.2011.101"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/DFTVS.2003.1250158"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/71.774911"}],"event":{"name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","start":{"date-parts":[[2015,10,12]]},"location":"Amherst, MA, USA","end":{"date-parts":[[2015,10,14]]}},"container-title":["2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7304347\/7315124\/07315166.pdf?arnumber=7315166","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T20:21:37Z","timestamp":1490386897000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7315166\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/dft.2015.7315166","relation":{},"subject":[],"published":{"date-parts":[[2015,10]]}}}