{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:09:17Z","timestamp":1730214557508,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/dft.2017.8244443","type":"proceedings-article","created":{"date-parts":[[2018,1,9]],"date-time":"2018-01-09T21:19:51Z","timestamp":1515532791000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["On-line software-based self-test for ECC of embedded RAM memories"],"prefix":"10.1109","author":[{"given":"M.","family":"Restifo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Bernardi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"De Luca","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Sansonetti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC.2007.373867"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766651"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.913755"},{"journal-title":"AUTOSAR Operating System","year":"0","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TENCON.2013.6718953"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.298"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.15"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2479618"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2010.5491773"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457210"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.40"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1147\/rd.282.0124"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.2002.1029769"},{"journal-title":"ISO 26262-1 2011-Road Vehicles?Functional Safety","year":"2011","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1995.466385"},{"key":"ref7","article-title":"Dependable design technique for system-on-chip","volume":"2008","author":"kubal\u00ed","year":"2008","journal-title":"Journal of Systems Architecture"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1950.tb00463.x"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/0471792748"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.885828"}],"event":{"name":"2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2017,10,23]]},"location":"Cambridge","end":{"date-parts":[[2017,10,25]]}},"container-title":["2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8227263\/8244422\/08244443.pdf?arnumber=8244443","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,2,6]],"date-time":"2020-02-06T16:42:44Z","timestamp":1581007364000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8244443\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/dft.2017.8244443","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}