{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T07:29:53Z","timestamp":1725607793457},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/dft.2017.8244465","type":"proceedings-article","created":{"date-parts":[[2018,1,9]],"date-time":"2018-01-09T16:19:51Z","timestamp":1515514791000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Improving test compression with multiple-polynomial LFSRs"],"prefix":"10.1109","author":[{"given":"Yu-Wei","family":"Lee","sequence":"first","affiliation":[]},{"given":"Nur A.","family":"Touba","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966711"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990304"},{"key":"ref6","first-page":"58","author":"pless","year":"2011","journal-title":"Introduction to the Theory of Error-Correcting Codes"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401557"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.826558"},{"key":"ref2","first-page":"237","article-title":"LFSR-Coded Test Patterns for Scan Designs","author":"k\u00f6nemann","year":"1991","journal-title":"Proc of European Test Conference"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/12.364534"}],"event":{"name":"2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2017,10,23]]},"location":"Cambridge","end":{"date-parts":[[2017,10,25]]}},"container-title":["2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8227263\/8244422\/08244465.pdf?arnumber=8244465","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,2,5]],"date-time":"2018-02-05T17:35:36Z","timestamp":1517852136000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8244465\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/dft.2017.8244465","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}