{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:09:24Z","timestamp":1730214564943,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/dft.2018.8602958","type":"proceedings-article","created":{"date-parts":[[2019,1,9]],"date-time":"2019-01-09T01:46:18Z","timestamp":1546998378000},"page":"1-4","source":"Crossref","is-referenced-by-count":4,"title":["FPGA SEE Test with Ultra-High Energy Heavy Ions"],"prefix":"10.1109","author":[{"given":"Gianluca","family":"Furano","sequence":"first","affiliation":[]},{"given":"Antonis","family":"Tavoularis","sequence":"additional","affiliation":[]},{"given":"Lucana","family":"Santos","sequence":"additional","affiliation":[]},{"given":"Veronique","family":"Ferlet-Cavrois","sequence":"additional","affiliation":[]},{"given":"Cesar","family":"Boatella","sequence":"additional","affiliation":[]},{"given":"Ruben","family":"Garcia Alia","sequence":"additional","affiliation":[]},{"given":"Pablo","family":"Fernandez Martinez","sequence":"additional","affiliation":[]},{"given":"Maria","family":"Kastriotou","sequence":"additional","affiliation":[]},{"given":"Vanessa","family":"Wyrwoll","sequence":"additional","affiliation":[]},{"given":"Salvatore","family":"Danzeca","sequence":"additional","affiliation":[]},{"given":"Maris","family":"Tali","sequence":"additional","affiliation":[]},{"given":"Dejan","family":"Gacnik","sequence":"additional","affiliation":[]},{"given":"Iztok","family":"Kramberger","sequence":"additional","affiliation":[]},{"given":"Lars","family":"Juul","sequence":"additional","affiliation":[]},{"given":"Konstantinos","family":"Maragos","sequence":"additional","affiliation":[]},{"given":"George","family":"Lentaris","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2015.7336716"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2014.6927416"},{"key":"ref10","article-title":"Design of generic can node for esmo mission","author":"kramberger","year":"2012","journal-title":"4S Symposium"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.2514\/1.I010555"},{"key":"ref11","article-title":"Exploring coremarka benchmark maximizing simplicity and efficacy","author":"gal-on","year":"2012","journal-title":"The Embedded Microprocessor Benchmark Consortium"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2015.7336714"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2015.7336735"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1990.89371"},{"key":"ref2","article-title":"In support of a fpga criticality defined validation, with particular focus on radiation effects","volume":"720","author":"furano","year":"2013","journal-title":"Proceedings of DASIA 2013 Data Systems in Aerospace"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2016.7684084"},{"key":"ref1","first-page":"253","article-title":"Roadmap for on-board processing and data handling systems in space","author":"furano","year":"2018","journal-title":"IEEE Symposium on Nanoscale Architectures"}],"event":{"name":"2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2018,10,8]]},"location":"Chicago, IL","end":{"date-parts":[[2018,10,10]]}},"container-title":["2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8586781\/8602813\/08602958.pdf?arnumber=8602958","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T01:59:39Z","timestamp":1643162379000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8602958\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/dft.2018.8602958","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}