{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:09:31Z","timestamp":1730214571806,"version":"3.28.0"},"reference-count":51,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/dft.2019.8875270","type":"proceedings-article","created":{"date-parts":[[2019,10,21]],"date-time":"2019-10-21T20:19:21Z","timestamp":1571689161000},"page":"8138-8143","source":"Crossref","is-referenced-by-count":10,"title":["Rebooting Computing: The Challenges for Test and Reliability"],"prefix":"10.1109","author":[{"given":"A.","family":"Bosio","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Hamdioui","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I.","family":"O'Connor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G. S.","family":"Rodrigues","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F. K.","family":"Lima","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E. I.","family":"Vatajelu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Di Natale","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Anghel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Nagarajan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M. C.","family":"R. Fieback","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2018.2831698"},{"key":"ref38","first-page":"30","article-title":"Intrinsic switching variability in HfO2 RRAM","author":"fantini","year":"2013","journal-title":"IM 2013 IEEE"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008320716847"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624749"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624895"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/NVMTS.2013.6632866"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2015.09.004"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/31\/6\/063002"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2016.2546199"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386943"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.12"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176603"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2017.7918289"},{"key":"ref2","article-title":"Future of computer architecture","author":"patterson","year":"2006","journal-title":"Berkeley EECS Annual Research Symposium (BEARS)"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-642-23096-7","article-title":"Chips 2020","author":"hoefflinger","year":"2012","journal-title":"The Frontiers Collection"},{"key":"ref20","first-page":"2072","article-title":"Exploring the use of approximate tmr to mask transient faults in logic with low area overhead,” Microelectronics Reliability","volume":"55","author":"gomes","year":"0","journal-title":"Proc of the 7th European Symposium on Reliability of Electron Devices Failure Physics and Analysis"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/23\/30\/305205"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DCIS.2018.8681499"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715020"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3173162.3173171"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2017.39"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2019.8702542"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758653"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1038\/nature08940"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898064"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2009.5424411"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3389\/fnins.2011.00073"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131488"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2017.8046207"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569370"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2017.7906764"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2018.8349675"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-78890-6_52"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2018.8474122"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927083"},{"key":"ref3","first-page":"1718","article-title":"Memristor based computation-in-memory architecture for data-intensive applications","author":"hamdioui","year":"0","journal-title":"2015 Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2015.2505723"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/nature16961"},{"key":"ref8","first-page":"45","author":"rehman","year":"2019","journal-title":"Heterogeneous Approximate Multipliers Architectures and Design Methodologies"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-018-5734-9"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2018.8644897"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342278"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2855145"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8341970"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2017.2691263"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2013.2250995"},{"key":"ref42","first-page":"10.1.1","article-title":"Improvement of data retention in HfO2\/Hf 1T1R RRAM cell under low operating current","author":"chen","year":"2013","journal-title":"IEEE IEDM 2013"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2017.11.003"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1162\/0899766053723096"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/NANOARCH.2017.8053727"}],"event":{"name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2019,10,2]]},"location":"Noordwijk, Netherlands","end":{"date-parts":[[2019,10,4]]}},"container-title":["2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8863044\/8875268\/08875270.pdf?arnumber=8875270","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T16:25:27Z","timestamp":1658247927000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8875270\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":51,"URL":"https:\/\/doi.org\/10.1109\/dft.2019.8875270","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}