{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:09:35Z","timestamp":1730214575895,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/dft.2019.8875345","type":"proceedings-article","created":{"date-parts":[[2019,10,22]],"date-time":"2019-10-22T00:19:21Z","timestamp":1571703561000},"page":"1-6","source":"Crossref","is-referenced-by-count":10,"title":["On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification"],"prefix":"10.1109","author":[{"given":"Annachiara","family":"Ruospo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Riccardo","family":"Cantoro","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ernesto","family":"Sanchez","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pasquale Davide","family":"Schiavone","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Angelo","family":"Garofalo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luca","family":"Benini","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2014.6962090"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2018.2795643"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2018.8644818"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203886"},{"key":"ref14","first-page":"1","article-title":"Flight safety certification implications for complex multi-core processor based avionics systems","author":"athavale","year":"2019","journal-title":"2019 IEEE International Reliability Physics (IRPS)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"journal-title":"Fault tolerance in autonomous systems How and how much?","year":"2005","author":"lussier","key":"ref3"},{"key":"ref6","first-page":"920","author":"bernardi","year":"2019","journal-title":"Non-intrusive self-test library for automotive critical applications Constraints and solutions"},{"key":"ref5","first-page":"177","author":"jasnetski","year":"2016","journal-title":"On automatic software-based self-test program generation based on high-level decision diagrams"},{"key":"ref8","first-page":"1","article-title":"A 64mw dnn-based visual navigation engine for autonomous nano-drones","volume":"pp","author":"palossi","year":"2019","journal-title":"IEEE Internet of Things Journal"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2654506"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3194085.3194091"},{"key":"ref1","first-page":"707","author":"devos","year":"2018","journal-title":"Development of autonomous drones for adaptive obstacle avoidance in real world environments"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2018.8644846"}],"event":{"name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2019,10,2]]},"location":"Noordwijk, Netherlands","end":{"date-parts":[[2019,10,4]]}},"container-title":["2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8863044\/8875268\/08875345.pdf?arnumber=8875345","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,19]],"date-time":"2022-07-19T20:25:27Z","timestamp":1658262327000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8875345\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/dft.2019.8875345","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}