{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,19]],"date-time":"2024-11-19T18:12:36Z","timestamp":1732039956489,"version":"3.28.0"},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/dft50435.2020.9250837","type":"proceedings-article","created":{"date-parts":[[2020,11,11]],"date-time":"2020-11-11T22:04:48Z","timestamp":1605132288000},"page":"1-4","source":"Crossref","is-referenced-by-count":5,"title":["Reliable Classification with Ensemble Convolutional Neural Networks"],"prefix":"10.1109","member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/72.363479"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICNN.1993.298655"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.1990.137773"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0893-6080(96)00089-5"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/72.963771"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-2312(99)00150-2"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/SiPS.2017.8110024"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2019.2963268"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1201\/b12207"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2017.2766583"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2705069"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2939726"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2913958"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2014.6834876"},{"journal-title":"International Standard","article-title":"ISO 26262: Road vehicles — Functional safety","year":"2011","key":"ref7"},{"key":"ref2","article-title":"Going deeper with convolutions, Computing Research Repository","author":"szegedy","year":"0","journal-title":"CVPR 2015"},{"journal-title":"Fault-Tolerance Techniques for SRAM-based FPGAs","year":"2006","author":"kastensmidt","key":"ref9"},{"key":"ref1","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"0","journal-title":"ICLR 2015"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2015.2477042"},{"key":"ref22","volume":"30","author":"reviriego","year":"2013","journal-title":"IEEE Design & Test of Computers"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2817023"},{"key":"ref24","article-title":"Batch normalization: Accelerating deep network training by reducing internal covariate shift","author":"ioffe","year":"0","journal-title":"ICML 2015"},{"journal-title":"Proper implementation of ResNet-s for CIFAR10\/100 in pytorch that matches description of the original paper","year":"0","author":"akamaster","key":"ref23"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.06.032"},{"article-title":"Deeply-Supervised nets","year":"2014","author":"lee","key":"ref25"}],"event":{"name":"2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2020,10,19]]},"location":"Frascati, Italy","end":{"date-parts":[[2020,10,21]]}},"container-title":["2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9250742\/9250725\/09250837.pdf?arnumber=9250837","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:44:53Z","timestamp":1656344693000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9250837\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/dft50435.2020.9250837","relation":{},"subject":[],"published":{"date-parts":[[2020]]}}}