{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:27:33Z","timestamp":1749619653182,"version":"3.28.0"},"reference-count":31,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,10,19]],"date-time":"2020-10-19T00:00:00Z","timestamp":1603065600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,10,19]],"date-time":"2020-10-19T00:00:00Z","timestamp":1603065600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,10,19]],"date-time":"2020-10-19T00:00:00Z","timestamp":1603065600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,10,19]]},"DOI":"10.1109\/dft50435.2020.9250865","type":"proceedings-article","created":{"date-parts":[[2020,11,11]],"date-time":"2020-11-11T17:04:48Z","timestamp":1605114288000},"page":"1-6","source":"Crossref","is-referenced-by-count":19,"title":["Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems"],"prefix":"10.1109","author":[{"given":"Lucas Matana","family":"Luza","sequence":"first","affiliation":[]},{"given":"Daniel","family":"Soderstrom","sequence":"additional","affiliation":[]},{"given":"Georgios","family":"Tsiligiannis","sequence":"additional","affiliation":[]},{"given":"Helmut","family":"Puchner","sequence":"additional","affiliation":[]},{"given":"Carlo","family":"Cazzaniga","sequence":"additional","affiliation":[]},{"given":"Ernesto","family":"Sanchez","sequence":"additional","affiliation":[]},{"given":"Alberto","family":"Bosio","sequence":"additional","affiliation":[]},{"given":"Luigi","family":"Dilillo","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2013.6604066"},{"journal-title":"Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices","first-page":"89a","year":"2006","key":"ref30"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CAHPC.2018.8645906"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9040557"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-018-5734-9"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.cag.2013.03.003"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2503210.2503296"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICIIP.2013.6707620"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.5286\/ISIS.E.RB2010438"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1021\/1\/012037"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2018.2879027"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2018.06.016"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.1998.705953"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.312"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-0938-1"},{"key":"ref3","article-title":"Resiliency of deep neural networks under quantization","volume":"abs 1511 6488","author":"sung","year":"2015","journal-title":"CoRR"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/9781118084328"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DSN-W.2017.47"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3126908.3126964"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000150"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488873"},{"year":"2016","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2893356"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS48698.2020.9080918"},{"journal-title":"CEA-LIST N2D2","year":"0","key":"ref21"},{"journal-title":"PG036 Soft Error Mitigation Controller v4 1 Product Guide","year":"2018","key":"ref24"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/C2015-0-00180-0"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2363123"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1996.494337"}],"event":{"name":"2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2020,10,19]]},"location":"Frascati, Italy","end":{"date-parts":[[2020,10,21]]}},"container-title":["2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9250742\/9250725\/09250865.pdf?arnumber=9250865","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T11:44:52Z","timestamp":1656330292000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9250865\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,10,19]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/dft50435.2020.9250865","relation":{},"subject":[],"published":{"date-parts":[[2020,10,19]]}}}