{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:09:51Z","timestamp":1730214591708,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,10,19]],"date-time":"2020-10-19T00:00:00Z","timestamp":1603065600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,10,19]],"date-time":"2020-10-19T00:00:00Z","timestamp":1603065600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,10,19]],"date-time":"2020-10-19T00:00:00Z","timestamp":1603065600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,10,19]]},"DOI":"10.1109\/dft50435.2020.9250906","type":"proceedings-article","created":{"date-parts":[[2020,11,11]],"date-time":"2020-11-11T17:04:48Z","timestamp":1605114288000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["A novel Network-on-Chip security algorithm for tolerating Byzantine faults"],"prefix":"10.1109","author":[{"given":"Soultana","family":"Ellinidou","sequence":"first","affiliation":[]},{"given":"Gaurav","family":"Sharma","sequence":"additional","affiliation":[]},{"given":"Olivier","family":"Markowitch","sequence":"additional","affiliation":[]},{"given":"Guy","family":"Gogniat","sequence":"additional","affiliation":[]},{"given":"Jean-Michel","family":"Dricot","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"177","article-title":"Hq replication: A hybrid quorum protocol for byzantine fault tolerance","author":"cowling","year":"2006","journal-title":"Proceedings of the Operating Systems Design and Implementation Symposium"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1658357.1658358"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1323293.1294280"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TST.2015.7350015"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2015.06.024"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CLOUD.2011.16"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/APSCC.2012.56"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2019.00019"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/WARTIA.2014.6976396"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2018.07.005"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-68511-3"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2003.1195021"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2018.8623972"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/NOCS.2007.32"},{"key":"ref8","first-page":"173","article-title":"Practical byzantine fault tolerance","volume":"99","author":"castro","year":"1999","journal-title":"OSDI"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2017.03.005"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2003.1225959"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/357172.357176"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1095809.1095817"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2009.4919636"}],"event":{"name":"2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2020,10,19]]},"location":"Frascati, Italy","end":{"date-parts":[[2020,10,21]]}},"container-title":["2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9250742\/9250725\/09250906.pdf?arnumber=9250906","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T11:44:52Z","timestamp":1656330292000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9250906\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,10,19]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/dft50435.2020.9250906","relation":{},"subject":[],"published":{"date-parts":[[2020,10,19]]}}}