{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:10:08Z","timestamp":1730214608478,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,6]]},"DOI":"10.1109\/dft52944.2021.9568317","type":"proceedings-article","created":{"date-parts":[[2021,10,20]],"date-time":"2021-10-20T19:30:07Z","timestamp":1634758207000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["FIRECAP: Fail-Reason Capturing hardware module for a RISC-V based System on a Chip"],"prefix":"10.1109","author":[{"given":"Sebastien","family":"Thomet","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Serge","family":"De-Paoli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jean-Marc","family":"Daveau","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Valerie","family":"Bertin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fady","family":"Abouzeid","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Philippe","family":"Roche","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fakhreddine","family":"Ghaffari","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Olivier","family":"Romain","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763096"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC.2014.6948950"},{"key":"ref10","first-page":"183","article-title":"First failure data capture in embedded system","author":"sun","year":"0","journal-title":"2007 IEEE International Conference on Electro\/Information Technology"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1992.243568"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2018.8347235"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2010.5512781"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2019.2956204"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2019.2921767"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2456014"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146916"},{"key":"ref9","first-page":"2532","volume":"62","author":"quinn","year":"2015","journal-title":"Software resilience and the effectiveness of software mitigation in microcontrollers"}],"event":{"name":"2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2021,10,6]]},"location":"Athens, Greece","end":{"date-parts":[[2021,10,8]]}},"container-title":["2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9568273\/9568279\/09568317.pdf?arnumber=9568317","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:47:20Z","timestamp":1652197640000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9568317\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,6]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/dft52944.2021.9568317","relation":{},"subject":[],"published":{"date-parts":[[2021,10,6]]}}}