{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T07:46:38Z","timestamp":1767771998296,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,6]]},"DOI":"10.1109\/dft52944.2021.9568318","type":"proceedings-article","created":{"date-parts":[[2021,10,20]],"date-time":"2021-10-20T19:30:07Z","timestamp":1634758207000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["An In-Depth Vulnerability Analysis of RISC-V Micro-Architecture Against Fault Injection Attack"],"prefix":"10.1109","author":[{"given":"Zahra","family":"Kazemi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amin","family":"Norollah","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Afef","family":"Kchaou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mahdi","family":"Fazeli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David","family":"Hely","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincent","family":"Beroulle","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2019.00010"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-64647-3_13"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/Trustcom\/BigDataSE\/ICESS.2017.250"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2014.6850649"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"2079","DOI":"10.3390\/jlpea9010009","article-title":"A fresh view on the microarchitectural design of fpga-based rise cpus in the iot era","volume":"9","author":"scotti","year":"2019","journal-title":"Journal of Low Power Electronics and Applications"},{"journal-title":"The RISC-V Instruction Set Manual User-Level ISA Berkeley","year":"0","author":"waterman","key":"ref15"},{"journal-title":"Gate-level leakage assessment and mitigation","year":"2019","author":"kathuria","key":"ref16"},{"journal-title":"Fault attacks on embedded software New directions in modeling design and mitigation","year":"2018","author":"yuce","key":"ref17"},{"journal-title":"The RISC-V Reader an open architecture Atlas Strawberry Canyon","year":"2017","author":"patterson","key":"ref18"},{"key":"ref19","volume":"16","author":"yuce","year":"2017","journal-title":"Analyzing the fault injection sensitivity of secure embedded software"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IVSW.2019.8854391"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"1153","DOI":"10.3390\/electronics9071153","article-title":"A review on evaluation and configuration of fault injection attack instruments to design attack resistant mcu-based iot applications","volume":"9","author":"kazemi","year":"2020","journal-title":"Electronics"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3299874.3317978"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS50870.2020.9159739"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-08302-5_15"},{"article-title":"Fault Mitigation Pattern","year":"2020","author":"whitteman","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-15-6198-6_20"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICICT.2017.8320166"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2019.i2.199-224"},{"article-title":"Ripes","year":"0","author":"petersen","key":"ref20"}],"event":{"name":"2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2021,10,6]]},"location":"Athens, Greece","end":{"date-parts":[[2021,10,8]]}},"container-title":["2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9568273\/9568279\/09568318.pdf?arnumber=9568318","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:47:21Z","timestamp":1652197641000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9568318\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,6]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/dft52944.2021.9568318","relation":{},"subject":[],"published":{"date-parts":[[2021,10,6]]}}}