{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T23:22:28Z","timestamp":1725578548981},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,6]]},"DOI":"10.1109\/dft52944.2021.9568337","type":"proceedings-article","created":{"date-parts":[[2021,10,20]],"date-time":"2021-10-20T19:30:07Z","timestamp":1634758207000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Dependence of SEUs in Digital Cameras on Pixel size and Elevation"],"prefix":"10.1109","author":[{"given":"Glenn H.","family":"Chapman","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Simone","family":"Neufeld","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Klinsmann","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Israel","family":"Koren","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zahava","family":"Koren","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Coelho","family":"Silva Meneses","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFT50435.2020.9250888"},{"key":"ref11","article-title":"Observing Ultra-High Energy Cosmic Rays with Smartphones","author":"whiteson","year":"0","journal-title":"1410 2895v2 [astro-ph IM]"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1147\/rd.401.0019"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.839134"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2495324"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.927662"},{"journal-title":"Enhanced Digital Imager Defect Analysis with Smaller Pixel Sizes","year":"2016","author":"thomas","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.08.016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.885005"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.835113"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065585"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2015.7315133"},{"journal-title":"Architecture design for soft errors Elsevier","year":"2008","author":"mukherjee","key":"ref1"},{"key":"ref9","article-title":"Exploring Soft Errors (SEU s) with Digital Imager Pixels ranging from 7 um to 1.2 ?m","author":"chapman","year":"2017","journal-title":"Proc IEEE Int Sym on DFT"}],"event":{"name":"2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2021,10,6]]},"location":"Athens, Greece","end":{"date-parts":[[2021,10,8]]}},"container-title":["2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9568273\/9568279\/09568337.pdf?arnumber=9568337","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:47:21Z","timestamp":1652197641000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9568337\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,6]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/dft52944.2021.9568337","relation":{},"subject":[],"published":{"date-parts":[[2021,10,6]]}}}