{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,25]],"date-time":"2025-06-25T06:24:23Z","timestamp":1750832663132,"version":"3.37.3"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,6]],"date-time":"2021-10-06T00:00:00Z","timestamp":1633478400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["1807974"],"award-info":[{"award-number":["1807974"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,6]]},"DOI":"10.1109\/dft52944.2021.9568353","type":"proceedings-article","created":{"date-parts":[[2021,10,20]],"date-time":"2021-10-20T19:30:07Z","timestamp":1634758207000},"page":"1-4","source":"Crossref","is-referenced-by-count":1,"title":["Fault Tolerance for Islandable-Microgrid Sensors"],"prefix":"10.1109","author":[{"given":"Vijay K.","family":"Jain","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Glenn H.","family":"Chapman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2011.17"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1979.4314779"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2008.4517888"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/96.311783"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2010.46"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/SECON.2018.8479077"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PCT.2007.4538363"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2012.2232945"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2002.807043"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2006.873018"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/APPEEC.2010.5448626"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2107751"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MPE.2008.918720"},{"journal-title":"Microgrids Architectures and Control (book)","year":"2014","author":"hatziargyriou","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2007.893372"}],"event":{"name":"2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2021,10,6]]},"location":"Athens, Greece","end":{"date-parts":[[2021,10,8]]}},"container-title":["2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9568273\/9568279\/09568353.pdf?arnumber=9568353","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:47:21Z","timestamp":1652197641000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9568353\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,6]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/dft52944.2021.9568353","relation":{},"subject":[],"published":{"date-parts":[[2021,10,6]]}}}