{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T03:22:41Z","timestamp":1772767361170,"version":"3.50.1"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,19]],"date-time":"2022-10-19T00:00:00Z","timestamp":1666137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,19]],"date-time":"2022-10-19T00:00:00Z","timestamp":1666137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,19]]},"DOI":"10.1109\/dft56152.2022.9962341","type":"proceedings-article","created":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T15:55:13Z","timestamp":1669910113000},"page":"1-6","source":"Crossref","is-referenced-by-count":8,"title":["Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Process"],"prefix":"10.1109","author":[{"given":"Corrado De","family":"Sio","sequence":"first","affiliation":[{"name":"Politecnico di Torino,Dipartimento di Automatica e Informatica (DAUIN),Turin,Italy"}]},{"given":"Sarah","family":"Azimi","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dipartimento di Automatica e Informatica (DAUIN),Turin,Italy"}]},{"given":"Luca","family":"Sterpone","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dipartimento di Automatica e Informatica (DAUIN),Turin,Italy"}]},{"given":"David Merodio","family":"Codinachs","sequence":"additional","affiliation":[{"name":"European Space Agency (ESA) European Space Research and Technology Centre,Noordwijk,The Netherlands"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFT50435.2020.9250872"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2022.3152668"},{"key":"ref12","first-page":"1","article-title":"Single Event Upset Characterization of the Zynq-7000 ARM® Cortex™-A9 Processor Unit Using Proton Irradiation","author":"hiemstra","year":"2015","journal-title":"2015 IEEE Radiation Effects Data Workshop (REDW)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2017.7906762"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2015.7336714"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2015.7365643"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s41365-021-00943-6"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/RSP.2018.8632000"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2020.3023287"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6641\/32\/1\/013006"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DFT52944.2021.9568342"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1674-4926\/32\/9\/092001"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10243160"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DFT50435.2020.9250865"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2365042"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456992"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2014.7004596"}],"event":{"name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","location":"Austin, TX, USA","start":{"date-parts":[[2022,10,19]]},"end":{"date-parts":[[2022,10,21]]}},"container-title":["2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9962319\/9962334\/09962341.pdf?arnumber=9962341","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T05:41:44Z","timestamp":1769492504000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9962341\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,19]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/dft56152.2022.9962341","relation":{},"subject":[],"published":{"date-parts":[[2022,10,19]]}}}