{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,10]],"date-time":"2025-12-10T09:00:56Z","timestamp":1765357256843,"version":"3.37.3"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,19]],"date-time":"2022-10-19T00:00:00Z","timestamp":1666137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,19]],"date-time":"2022-10-19T00:00:00Z","timestamp":1666137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100010002","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100010002","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,19]]},"DOI":"10.1109\/dft56152.2022.9962345","type":"proceedings-article","created":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:31:33Z","timestamp":1669854693000},"page":"1-6","source":"Crossref","is-referenced-by-count":12,"title":["Evaluating Read Disturb Effect on RRAM based AI Accelerator with Multilevel States and Input Voltages"],"prefix":"10.1109","author":[{"given":"Jianan","family":"Wen","sequence":"first","affiliation":[{"name":"IHP-Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany"}]},{"given":"Andrea","family":"Baroni","sequence":"additional","affiliation":[{"name":"IHP-Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany"}]},{"given":"Eduardo","family":"Perez","sequence":"additional","affiliation":[{"name":"IHP-Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany"}]},{"given":"Markus","family":"Ulbricht","sequence":"additional","affiliation":[{"name":"IHP-Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany"}]},{"given":"Christian","family":"Wenger","sequence":"additional","affiliation":[{"name":"IHP-Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany"}]},{"given":"Milos","family":"Krstic","sequence":"additional","affiliation":[{"name":"IHP-Leibniz-Institut für innovative Mikroelektronik,Frankfurt (Oder),Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3065386"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2761740"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2021.3092533"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898010"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001139"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001140"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.5124915"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2017.8066581"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9129252"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3101209"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10060645"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3072868"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2019.2931769"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.5108650"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2730959"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3141370"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-020-1942-4"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.5143815"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"key":"ref20","article-title":"Very deep convolutional networks for large-scale image recognition","volume":"abs\/1409.1556","author":"Simonyan","year":"2014","journal-title":"CoRR"}],"event":{"name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2022,10,19]]},"location":"Austin, TX, USA","end":{"date-parts":[[2022,10,21]]}},"container-title":["2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9962319\/9962334\/09962345.pdf?arnumber=9962345","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T06:20:58Z","timestamp":1706077258000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9962345\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,19]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/dft56152.2022.9962345","relation":{},"subject":[],"published":{"date-parts":[[2022,10,19]]}}}