{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T08:12:48Z","timestamp":1725610368170},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,19]],"date-time":"2022-10-19T00:00:00Z","timestamp":1666137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,19]],"date-time":"2022-10-19T00:00:00Z","timestamp":1666137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,19]]},"DOI":"10.1109\/dft56152.2022.9962346","type":"proceedings-article","created":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:31:33Z","timestamp":1669854693000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["A Polarity-Driven Radiation-Hardened Latch design for Single Event Upset Tolerance"],"prefix":"10.1109","author":[{"given":"Shanshan","family":"Liu","sequence":"first","affiliation":[{"name":"New Mexico State University,Klipsch School of Electrical and Computer Engineering,Las Cruces,USA"}]},{"given":"Guo","family":"Jing","sequence":"additional","affiliation":[{"name":"North University of China,School of Instrument and Electronics,Taiyuan,China"}]},{"given":"Xiaochen","family":"Tang","sequence":"additional","affiliation":[{"name":"New Mexico State University,Klipsch School of Electrical and Computer Engineering,Las Cruces,USA"}]},{"given":"Pedro","family":"Reviriego","sequence":"additional","affiliation":[{"name":"Universidad Carlos III de Madrid,Telematic Engineering Department,Madrid,Spain"}]},{"given":"Fabrizio","family":"Lombardi","sequence":"additional","affiliation":[{"name":"Northeastern University, USA,Department of Electrical and Computer Engineering,USA"}]}],"member":"263","event":{"name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2022,10,19]]},"location":"Austin, TX, USA","end":{"date-parts":[[2022,10,21]]}},"container-title":["2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9962319\/9962334\/09962346.pdf?arnumber=9962346","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,19]],"date-time":"2022-12-19T20:09:27Z","timestamp":1671480567000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9962346\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,19]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/dft56152.2022.9962346","relation":{},"subject":[],"published":{"date-parts":[[2022,10,19]]}}}