{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:26:08Z","timestamp":1740101168937,"version":"3.37.3"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,19]],"date-time":"2022-10-19T00:00:00Z","timestamp":1666137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,19]],"date-time":"2022-10-19T00:00:00Z","timestamp":1666137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001321","name":"National Research Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001321","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,19]]},"DOI":"10.1109\/dft56152.2022.9962359","type":"proceedings-article","created":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T20:55:13Z","timestamp":1669928113000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Efficient Loop Abort Fault Attacks on Supersingular Isogeny based Key Exchange (SIKE)"],"prefix":"10.1109","author":[{"given":"Piyush","family":"Beegala","sequence":"first","affiliation":[{"name":"Indian Institute of Technology Kanpur,Kanpur,208016"}]},{"given":"Debapriya Basu","family":"Roy","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology Kanpur,Kanpur,208016"}]},{"given":"Prasanna","family":"Ravi","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,Singapore,639798"}]},{"given":"Shivam","family":"Bhasin","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,Singapore,639798"}]},{"given":"Anupam","family":"Chattopadhyay","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,Singapore,639798"}]},{"given":"Debdeep","family":"Mukhopadhyay","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology Kharagpur,Kharagpur,721302"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-89915-8_12"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-59879-6_6"},{"key":"ref12","first-page":"104","article-title":"Safe-error attacks on sike and csidh","author":"campos","year":"2021","journal-title":"International Conference on Security Privacy and Applied Cryptography Engineering"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2014.22"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.145"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/18.259647"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-58691-1_68"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3197507.3197516"},{"key":"ref18","article-title":"An efficient key recovery attack on sidh (preliminary version)","author":"castryck","year":"2022","journal-title":"Cryptology ePrint Archive"},{"journal-title":"Sidh-spec pdf","year":"0","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-53018-4_21"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-53887-6_3"},{"key":"ref5","first-page":"147","article-title":"Generalization of vélu’s formulae for isogenies between elliptic curves","volume":"extra","author":"miret","year":"2007","journal-title":"Publicacions matemátiques 2007"},{"key":"ref8","article-title":"Failure is not an option: standardization issues for postquantum key agreement","author":"kirkwood","year":"2015","journal-title":"Workshop on Cybersecurity in a PostQuantum World"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_34"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-25405-5_2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1515\/jmc-2012-0015"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-59879-6_7"}],"event":{"name":"2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2022,10,19]]},"location":"Austin, TX, USA","end":{"date-parts":[[2022,10,21]]}},"container-title":["2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9962319\/9962334\/09962359.pdf?arnumber=9962359","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,26]],"date-time":"2022-12-26T19:45:07Z","timestamp":1672083907000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9962359\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,19]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/dft56152.2022.9962359","relation":{},"subject":[],"published":{"date-parts":[[2022,10,19]]}}}