{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,29]],"date-time":"2026-09-29T17:17:17Z","timestamp":1790702237880,"version":"4.1.0"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,3]],"date-time":"2023-10-03T00:00:00Z","timestamp":1696291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,3]],"date-time":"2023-10-03T00:00:00Z","timestamp":1696291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,3]]},"DOI":"10.1109\/dft59622.2023.10313531","type":"proceedings-article","created":{"date-parts":[[2023,11,14]],"date-time":"2023-11-14T18:48:30Z","timestamp":1699987710000},"page":"1-7","source":"Crossref","is-referenced-by-count":14,"title":["Evaluating the Impact of Aging on Path-Delay Self-Test Libraries"],"prefix":"10.1109","author":[{"given":"Riccardo","family":"Cantoro","sequence":"first","affiliation":[{"name":"Politecnico di Torino"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sandro","family":"Sartoni","sequence":"additional","affiliation":[{"name":"Politecnico di Torino"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[{"name":"Politecnico di Torino"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lorena","family":"Anghel","sequence":"additional","affiliation":[{"name":"Univ Grenoble Alpes,CNRS, Grenoble INP, TIMA,France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Michele","family":"Portolan","sequence":"additional","affiliation":[{"name":"Univ Grenoble Alpes,CNRS, Grenoble INP, TIMA,France"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VLDI-DAT.2013.6533827"},{"key":"ref3","first-page":"74","article-title":"The impact of bti aging on the reliability of level shifters in nano-scale cmos technology","volume-title":"Microelectronics Reliability","volume":"67","author":"Halak","year":"2016"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2016.30"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936355"},{"key":"ref6","article-title":"Management des performances de s\u00fbret\u00e9 et de s\u00e9curit\u00e9 pour les applications automotives et iot","volume-title":"Ph.D. dissertation","author":"Senthamarai Kannan","year":"2021"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DevIC50843.2021.9455859"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2012.6233015"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3105913"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2007.28"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.37"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894321"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ATS52891.2021.00025"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3268210"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS52814.2021.9486711"},{"issue":"16","key":"ref17","article-title":"A systematic method to generate effective stls for the in-field test of can bus controllers","volume-title":"Electronics","volume":"11","author":"da Silva","year":"2022"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"issue":"1","key":"ref19","first-page":"273","article-title":"Hot-electron emission from silicon into silicon dioxide","volume-title":"Solid-State Electronics","volume":"21","author":"Ning","year":"1978"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC.2011.6138626"},{"issue":"9","key":"ref21","first-page":"1753","article-title":"Time dependent dielectric breakdown physics \u2013 models revisited","volume-title":"Microelectronics Reliability","volume":"52","author":"McPherson","year":"2012"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2339364"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2040125"},{"key":"ref24","article-title":"Estimation de la performance des circuits num\u00e9riques sous variations pvt et vieillissement","volume-title":"Ph.D. dissertation","author":"Altieri Scarpato","year":"2017"},{"key":"ref25","volume-title":"CMOS VLSI Design: A Circuits and Systems Perspective","author":"Weste","year":"2010"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2017.7936357"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9781316402276"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-6849-3"},{"key":"ref29","article-title":"PULPino microcontroller system","year":"2022"},{"key":"ref30","article-title":"Mibench-embedded benchmark","author":"Bennett","year":"2023"}],"event":{"name":"2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","location":"Juan-Les-Pins, France","start":{"date-parts":[[2023,10,3]]},"end":{"date-parts":[[2023,10,5]]}},"container-title":["2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10313343\/10313345\/10313531.pdf?arnumber=10313531","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,2]],"date-time":"2024-03-02T16:36:01Z","timestamp":1709397361000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10313531\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,3]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/dft59622.2023.10313531","relation":{},"subject":[],"published":{"date-parts":[[2023,10,3]]}}}