{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T08:04:38Z","timestamp":1767773078434},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,3]],"date-time":"2023-10-03T00:00:00Z","timestamp":1696291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,3]],"date-time":"2023-10-03T00:00:00Z","timestamp":1696291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,3]]},"DOI":"10.1109\/dft59622.2023.10313558","type":"proceedings-article","created":{"date-parts":[[2023,11,14]],"date-time":"2023-11-14T18:48:30Z","timestamp":1699987710000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Analyzing the Reliability of Alternative Convolution Implementations for Deep Learning Applications"],"prefix":"10.1109","author":[{"given":"Cristiana","family":"Bolchini","sequence":"first","affiliation":[{"name":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy"}]},{"given":"Luca","family":"Cassano","sequence":"additional","affiliation":[{"name":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy"}]},{"given":"Antonio","family":"Miele","sequence":"additional","affiliation":[{"name":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy"}]},{"given":"Alessandro","family":"Nazzari","sequence":"additional","affiliation":[{"name":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy"}]},{"given":"Dario","family":"Passarello","sequence":"additional","affiliation":[{"name":"Informazione e Bioingegneria Politecnico di Milano,Dipartimento di Elettronica,Italy"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2010.0110"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMC.2019.2892451"},{"year":"2011","key":"ref3","article-title":"26262: Road vehicles - Functional safety"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.14"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/23.556861"},{"year":"2019","key":"ref6","article-title":"ACEA Report: Vehicles in use - Europe 2019"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2018.5026"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE52982.2021.00025"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS56730.2022.9897813"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DSN48987.2021.00018"},{"article-title":"cudnn: Efficient primitives for deep learning","year":"2014","author":"Chetlur","key":"ref11"},{"key":"ref12","first-page":"1","article-title":"Fast Convolutional Nets With fbfft: A GPU Performance Evaluation","volume-title":"Proc. Int. Conf. on Learning Representations","author":"Vasilache"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.435"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2918851"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3489517.3530531"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DFT56152.2022.9962339"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2022.3184274"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1989.1.4.541"},{"key":"ref19","article-title":"cuDNN"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3352460.3358307"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2008.31"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/DSN48987.2021.00042"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ATS47505.2019.000-8"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS56730.2022.9897815"}],"event":{"name":"2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2023,10,3]]},"location":"Juan-Les-Pins, France","end":{"date-parts":[[2023,10,5]]}},"container-title":["2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10313343\/10313345\/10313558.pdf?arnumber=10313558","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,13]],"date-time":"2024-03-13T20:15:17Z","timestamp":1710360917000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10313558\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,3]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/dft59622.2023.10313558","relation":{},"subject":[],"published":{"date-parts":[[2023,10,3]]}}}