{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,11]],"date-time":"2025-07-11T10:21:58Z","timestamp":1752229318090},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,3]],"date-time":"2023-10-03T00:00:00Z","timestamp":1696291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,3]],"date-time":"2023-10-03T00:00:00Z","timestamp":1696291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,3]]},"DOI":"10.1109\/dft59622.2023.10313560","type":"proceedings-article","created":{"date-parts":[[2023,11,14]],"date-time":"2023-11-14T18:48:30Z","timestamp":1699987710000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["A Machine Learning-driven EDAC Method for Space-Application Memory"],"prefix":"10.1109","author":[{"given":"Junchao","family":"Chen","sequence":"first","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marko","family":"Andjelkovic","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Milos","family":"Krstic","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vargas Fabian","family":"Luis","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813131"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2001.1159256"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1979.4330269"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.29"},{"key":"ref5","article-title":"A self-adaptive resilient method for implementing and managing the high-reliability processing system","volume-title":"doctoralthesis","author":"Chen","year":"2023"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1954.1057465"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1994.315652"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2837220"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.908787"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1029\/2018sw002061"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/2017SW001660"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/AHS.2017.8046352"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2176513"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2022.3143652"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-018-5738-5"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2022.3147376"},{"volume-title":"Advance composition explorer - solar isotope spectrometer database","key":"ref17"},{"volume-title":"Geostationary operational environmental satellites - space environment monitor database","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.835072"},{"volume-title":"Cr\u00c8me96 tool","key":"ref20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113799"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.07.060"},{"key":"ref23","article-title":"Analysis of single event radiation effects and fault mechanisms in sram, fram and nand flash : application to the mtcube nanosatellite project","volume-title":"PhD dissertation","author":"Gupta","year":"2017"},{"volume-title":"National oceanic and atmospheric administration solar proton events affecting the earth environment lists","key":"ref24"}],"event":{"name":"2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2023,10,3]]},"location":"Juan-Les-Pins, France","end":{"date-parts":[[2023,10,5]]}},"container-title":["2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10313343\/10313345\/10313560.pdf?arnumber=10313560","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,2]],"date-time":"2024-03-02T16:36:56Z","timestamp":1709397416000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10313560\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,3]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/dft59622.2023.10313560","relation":{},"subject":[],"published":{"date-parts":[[2023,10,3]]}}}