{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T23:26:15Z","timestamp":1768346775563,"version":"3.49.0"},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,8]],"date-time":"2024-10-08T00:00:00Z","timestamp":1728345600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,8]],"date-time":"2024-10-08T00:00:00Z","timestamp":1728345600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,8]]},"DOI":"10.1109\/dft63277.2024.10753499","type":"proceedings-article","created":{"date-parts":[[2024,11,20]],"date-time":"2024-11-20T18:56:38Z","timestamp":1732128998000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["An AI-Assisted Connection Weight Prediction for Regression Testing of Integrated Circuits"],"prefix":"10.1109","author":[{"given":"Abishaan","family":"Ravikumar","sequence":"first","affiliation":[{"name":"School of ECM, Oxford Brookes University,Oxford,UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaohan","family":"Yang","sequence":"additional","affiliation":[{"name":"Infineon Technologies, Bristol, U.K. Ltd."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rajendra","family":"Prasad","sequence":"additional","affiliation":[{"name":"Infineon Technologies, Bristol, U.K. Ltd."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"RajaNataraj","family":"Sivaraj","sequence":"additional","affiliation":[{"name":"Infineon Technologies, Bristol, U.K. Ltd."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexander","family":"Rast","sequence":"additional","affiliation":[{"name":"School of ECM, Oxford Brookes University,Oxford,UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abusaleh","family":"Jabir","sequence":"additional","affiliation":[{"name":"School of ECM, Oxford Brookes University,Oxford,UK"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"IEEE Spectrum","author":"Charette","year":"2010"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICIC.2009.114"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICISSGT52025.2021.00049"},{"key":"ref4","volume-title":"Smart adaptive regression using nearest neigh-bours algorithm","author":"Prasad","year":"2022"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MTV.2018.00018"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCIPT53667.2021.00030"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/PAIS.2018.8598527"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IMSNA.2013.6742804"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICTS58770.2023.10330830"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2001.986273"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VLSISOC.2007.4402501"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICAIS50930.2021.9396034"},{"key":"ref13","first-page":"583","article-title":"Optimizing random test constraints using machine learning algorithms","volume-title":"2017 design and verification conference and exhibition US(DVCon)","author":"Sokorac","year":"2017"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-019-05777-0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC52403.2022.9712550"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2018.8399764"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISMSIT56059.2022.9932693"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICNISC60562.2023.00036"},{"key":"ref19","volume-title":"Pytorch","year":"2024"},{"key":"ref20","volume-title":"arXiv preprint","author":"Reimers","year":"2019"},{"key":"ref21","volume-title":"Graphsage: Inductive representation learning on large graphs","author":"Leskovec","year":"2024"},{"key":"ref22","volume-title":"Gentle introduction to the rectified linear unit (relu)","author":"Brownlee","year":"2024"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1515\/jisys.1999.9.1.1"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/math11030682"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CECNet.2012.6201756"}],"event":{"name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","location":"Didcot, United Kingdom","start":{"date-parts":[[2024,10,8]]},"end":{"date-parts":[[2024,10,10]]}},"container-title":["2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10753497\/10753498\/10753499.pdf?arnumber=10753499","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T18:11:34Z","timestamp":1732731094000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10753499\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,8]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/dft63277.2024.10753499","relation":{},"subject":[],"published":{"date-parts":[[2024,10,8]]}}}