{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,10]],"date-time":"2026-03-10T15:41:42Z","timestamp":1773157302345,"version":"3.50.1"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,8]],"date-time":"2024-10-08T00:00:00Z","timestamp":1728345600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,8]],"date-time":"2024-10-08T00:00:00Z","timestamp":1728345600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,8]]},"DOI":"10.1109\/dft63277.2024.10753524","type":"proceedings-article","created":{"date-parts":[[2024,11,20]],"date-time":"2024-11-20T18:56:38Z","timestamp":1732128998000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Special Session: Reliability and Performance Evaluation of a RISC-V Vector Extension Unit for Vector Multiplication"],"prefix":"10.1109","author":[{"given":"Carolina","family":"Imianosky","sequence":"first","affiliation":[{"name":"University of Montpellier,IES, CNRS,Montpellier,France"}]},{"given":"Douglas A.","family":"Santos","sequence":"additional","affiliation":[{"name":"University of Montpellier,IES, CNRS,Montpellier,France"}]},{"given":"Douglas R.","family":"Melo","sequence":"additional","affiliation":[{"name":"University of Vale do Itajaí,LEDS,Itajaí,Brazil"}]},{"given":"Felipe","family":"Viel","sequence":"additional","affiliation":[{"name":"University of Vale do Itajaí,LEDS,Itajaí,Brazil"}]},{"given":"Luigi","family":"Dilillo","sequence":"additional","affiliation":[{"name":"University of Montpellier,IES, CNRS,Montpellier,France"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"RISC-V \u201cV\u201d Vector Extension","year":"2024"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.2514\/1.I010735"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DFT50435.2020.9250908"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DFT50435.2020.9250796"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/9781119107392"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS48698.2020.9081185"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12122557"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DFT59622.2023.10313569"},{"key":"ref9","volume-title":"Deep learning","author":"Goodfellow","year":"2016"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.2514\/1.I010916"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/FDL50818.2020.9232940"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774501"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2514\/1.I011097"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/OJCS.2024.3468895"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.5220\/0005957200610072"},{"key":"ref16","volume-title":"The RISC-V Reader: an open architecture Atlas","author":"Patterson","year":"2017"},{"key":"ref17","article-title":"The RISC-V instruction set manual","volume":"2","author":"Waterman","year":"2014","journal-title":"Volume I: User-Level ISA"},{"key":"ref18","volume-title":"Risc-v vector intrinsic document","year":"2024"},{"key":"ref19","volume-title":"Gnu toolchain for risc-v","year":"2024"},{"key":"ref20","author":"Hennessy","year":"2017","journal-title":"Computer organization and design RISC-V edition: The hardware software interface"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2005.21"}],"event":{"name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","location":"Didcot, United Kingdom","start":{"date-parts":[[2024,10,8]]},"end":{"date-parts":[[2024,10,10]]}},"container-title":["2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10753497\/10753498\/10753524.pdf?arnumber=10753524","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T18:11:35Z","timestamp":1732731095000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10753524\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,8]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/dft63277.2024.10753524","relation":{},"subject":[],"published":{"date-parts":[[2024,10,8]]}}}