{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T17:07:10Z","timestamp":1743440830114,"version":"3.29.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,8]],"date-time":"2024-10-08T00:00:00Z","timestamp":1728345600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,8]],"date-time":"2024-10-08T00:00:00Z","timestamp":1728345600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,8]]},"DOI":"10.1109\/dft63277.2024.10753528","type":"proceedings-article","created":{"date-parts":[[2024,11,20]],"date-time":"2024-11-20T18:56:38Z","timestamp":1732128998000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Digital Generation of RF Phase-Modulated Test Stimuli: Application to BPSK Modulation Scheme"],"prefix":"10.1109","author":[{"given":"K.","family":"Tahraoui","sequence":"first","affiliation":[{"name":"Univ. Montpellier,LIRMM, CNRS,Montpellier,France"}]},{"given":"R.","family":"Burelle","sequence":"additional","affiliation":[{"name":"Univ. Montpellier,LIRMM, CNRS,Montpellier,France"}]},{"given":"T.","family":"Vayssade","sequence":"additional","affiliation":[{"name":"Univ. Montpellier,LIRMM, CNRS,Montpellier,France"}]},{"given":"F.","family":"Lefevre","sequence":"additional","affiliation":[{"name":"NXP Semiconductors,Caen,France"}]},{"given":"L.","family":"Latorre","sequence":"additional","affiliation":[{"name":"Univ. Montpellier,LIRMM, CNRS,Montpellier,France"}]},{"given":"F.","family":"Aza\u00efs","sequence":"additional","affiliation":[{"name":"Univ. Montpellier,LIRMM, CNRS,Montpellier,France"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035303"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2016.2590978"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-011-5222-y"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035301"},{"key":"ref5","first-page":"396","article-title":"EVM measurement of RF ZigBee transceivers using standard digital ATE","volume-title":"Proc. Design, Automation & Test in Europe Conference (DATE)","author":"Vayssade","year":"2021"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2016.7524231"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2017.7995205"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2010.5502991"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2185309"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ETS50041.2021.9465473"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LATS62223.2024.10534627"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.1980.1090291"}],"event":{"name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2024,10,8]]},"location":"Didcot, United Kingdom","end":{"date-parts":[[2024,10,10]]}},"container-title":["2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10753497\/10753498\/10753528.pdf?arnumber=10753528","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T18:13:03Z","timestamp":1732731183000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10753528\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,8]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/dft63277.2024.10753528","relation":{},"subject":[],"published":{"date-parts":[[2024,10,8]]}}}