{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,16]],"date-time":"2026-06-16T18:51:34Z","timestamp":1781635894077,"version":"3.54.5"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,8]],"date-time":"2024-10-08T00:00:00Z","timestamp":1728345600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,8]],"date-time":"2024-10-08T00:00:00Z","timestamp":1728345600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,8]]},"DOI":"10.1109\/dft63277.2024.10753532","type":"proceedings-article","created":{"date-parts":[[2024,11,20]],"date-time":"2024-11-20T18:56:38Z","timestamp":1732128998000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Image Degradation due to Interacting Hot Pixels and SEUs"],"prefix":"10.1109","author":[{"given":"Glenn H.","family":"Chapman","sequence":"first","affiliation":[{"name":"School of Engineering Science, Simon Fraser University,Burnaby,B.C.,Canada,V5A 1S6"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Alireza","family":"Farahmandpour","sequence":"additional","affiliation":[{"name":"School of Engineering Science, Simon Fraser University,Burnaby,B.C.,Canada,V5A 1S6"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Amit","family":"Chakma","sequence":"additional","affiliation":[{"name":"School of Engineering Science, Simon Fraser University,Burnaby,B.C.,Canada,V5A 1S6"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Israel","family":"Koren","sequence":"additional","affiliation":[{"name":"University of Massachusetts,Dept. of Electrical and Computer Engineering,Amherst,MA,01003"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zahava","family":"Koren","sequence":"additional","affiliation":[{"name":"University of Massachusetts,Dept. of Electrical and Computer Engineering,Amherst,MA,01003"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1117\/12.704563"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1117\/12.806109"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.58"},{"key":"ref4","first-page":"231","article-title":"Tradeof Fs in imager design with respect to pixel defect rates","volume-title":"Proc. of the IEEE Intern. Symposium on Defect and Fault Tolerance in VLSI","author":"Leung"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.59"},{"key":"ref6","first-page":"7875011","article-title":"Tradeof Fs in imager design parameters for sensor reliability","volume-title":"Proc., Elect Imaging, Sensors, Cameras, and Systems for Industrial\/Scientific Applications XI","volume":"7875","author":"Leung"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.908906"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.927662"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1117\/12.2005850"},{"key":"ref10","volume-title":"Measurement and Analysis of Defect Development in Digital Imagers","author":"Leung","year":"2011"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.2352\/ISSN.2470-1173.2018.11.IMSE-401"},{"key":"ref12","volume-title":"Birthday Paradox Calculations and Approximation","author":"Hill","year":"2015"},{"key":"ref13","volume-title":"What Creates Noticeable Defects on Digital Imagers?","author":"Meneses","year":"2021"},{"key":"ref14","volume-title":"Median Filter for Reconstructing Missing Color Samples","author":"Freeman","year":"1988"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/83.784434"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DFT56152.2022.9962368"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/dft.2017.8244457"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/dft50435.2020.9250888"}],"event":{"name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","location":"Didcot, United Kingdom","start":{"date-parts":[[2024,10,8]]},"end":{"date-parts":[[2024,10,10]]}},"container-title":["2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10753497\/10753498\/10753532.pdf?arnumber=10753532","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T18:13:03Z","timestamp":1732731183000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10753532\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,8]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/dft63277.2024.10753532","relation":{},"subject":[],"published":{"date-parts":[[2024,10,8]]}}}