{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,16]],"date-time":"2026-01-16T00:41:11Z","timestamp":1768524071263,"version":"3.49.0"},"reference-count":35,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,8]],"date-time":"2024-10-08T00:00:00Z","timestamp":1728345600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,8]],"date-time":"2024-10-08T00:00:00Z","timestamp":1728345600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,8]]},"DOI":"10.1109\/dft63277.2024.10753536","type":"proceedings-article","created":{"date-parts":[[2024,11,20]],"date-time":"2024-11-20T18:56:38Z","timestamp":1732128998000},"page":"1-6","source":"Crossref","is-referenced-by-count":6,"title":["A Flexible FPGA-Based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems"],"prefix":"10.1109","author":[{"given":"Nicola","family":"di Gruttola Giardino","sequence":"first","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francesco","family":"Angione","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paolo","family":"Bernardi","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tommaso","family":"Foscale","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dip. di Automatica e Informatica,Turin,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Claudia","family":"Bertani","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincenzo","family":"Tancorre","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2010.5512791"},{"key":"ref2","volume-title":"Iso 26262-[1\u201310], road vehicles - functional safety","year":"2011"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS49688.2020.9301557"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LATS57337.2022.9936975"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2011.6116571"},{"key":"ref6","article-title":"Towards an automated flow for implementation of dedi - cated lbist scan chains for functional safety","author":"Tille","journal-title":"TUZ, 2020"},{"key":"ref7","first-page":"1","article-title":"Ieee draft standard test access port and boundary scan architecture","year":"2012","journal-title":"IEEE P1149.1\/D2012.e27"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS52814.2021.9486708"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/EPTC.2014.7028421"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.2178387"},{"key":"ref11","article-title":"System Level Test","author":"Reichert","journal-title":"Teradyne"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS50862.2020.9095569"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2019.8724644"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2009.5012141"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICECA49313.2020.9297569"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2007.4511139"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICEECCOT43722.2018.9001588"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651911"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.913760"},{"key":"ref20","article-title":"Elate: Embedded low cost automatic test equipment for fpga based testing of digital circuits","author":"Bayrakci","journal-title":"IEEE ELECO, 2017"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2018.8347236"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ETS54262.2022.9810388"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44778.2020.9325213"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2006.260996"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3316511"},{"key":"ref26","article-title":"Reliability engineering theory and practice","author":"Birolini","year":"2017","journal-title":"Springer"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2018.8373238"},{"key":"ref28","article-title":"Pynq","volume-title":"Xilinx"},{"key":"ref29","volume-title":"mmap","author":"Manual"},{"key":"ref30","first-page":"1","article-title":"Ieee standard test interface language (stil) for digital test vector data","year":"1999","journal-title":"IEEE Std 1450\u20131999"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2024.3500375"},{"key":"ref32","article-title":"Zynq ultrascale+ mpsoc zcul04 evaluation kit","volume-title":"AMD-Xilinx"},{"key":"ref33","volume-title":"Zynq ultrascale+ mpsoc zcul04 evaluation kit"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50671.2022.00044"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/VTS56346.2023.10140099"}],"event":{"name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","location":"Didcot, United Kingdom","start":{"date-parts":[[2024,10,8]]},"end":{"date-parts":[[2024,10,10]]}},"container-title":["2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10753497\/10753498\/10753536.pdf?arnumber=10753536","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T18:13:08Z","timestamp":1732731188000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10753536\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,8]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/dft63277.2024.10753536","relation":{},"subject":[],"published":{"date-parts":[[2024,10,8]]}}}