{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T12:45:36Z","timestamp":1755693936448,"version":"3.29.0"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,10,8]],"date-time":"2024-10-08T00:00:00Z","timestamp":1728345600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,8]],"date-time":"2024-10-08T00:00:00Z","timestamp":1728345600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,10,8]]},"DOI":"10.1109\/dft63277.2024.10753560","type":"proceedings-article","created":{"date-parts":[[2024,11,20]],"date-time":"2024-11-20T18:56:38Z","timestamp":1732128998000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Using High-Level Profiling Data to Early Assess the Robustness of Digital Systems"],"prefix":"10.1109","author":[{"given":"Luc","family":"Noizette","sequence":"first","affiliation":[{"name":"Univ. Grenoble Alpes, CNRS, Grenoble INP*, TIMA,Grenoble,France,38000"}]},{"given":"Florent","family":"Miller","sequence":"additional","affiliation":[{"name":"Nucletudes,Les-Ulis,France"}]},{"given":"Youri","family":"Helen","sequence":"additional","affiliation":[{"name":"French Ministry of Defense,Bruz,France"}]},{"given":"R\u00e9gis","family":"Leveugle","sequence":"additional","affiliation":[{"name":"Univ. Grenoble Alpes, CNRS, Grenoble INP*, TIMA,Grenoble,France,38000"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.2514\/1.I010555"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-54422-9_10"},{"key":"ref3","article-title":"From MOSFETs to FinFETs - The Soft Error Scaling Trends","volume-title":"RADNEXT","author":"Chatterjee","year":"2020"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3073259"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2023.3284899"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MTV.2014.27"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IISWC.2015.28"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2000254"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2939858"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/QRS.2015.13"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/23.903784"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2204775"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS53308.2021.9954474"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2021.3128501"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2007.56"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/PCCC.2014.7017065"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/int.22791"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IISWC.2012.6402908"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2017.7975274"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2498313"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2858773"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/PRIME55000.2022.9816811"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/WWC.2001.990739"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090716"}],"event":{"name":"2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2024,10,8]]},"location":"Didcot, United Kingdom","end":{"date-parts":[[2024,10,10]]}},"container-title":["2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10753497\/10753498\/10753560.pdf?arnumber=10753560","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T18:13:15Z","timestamp":1732731195000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10753560\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,8]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/dft63277.2024.10753560","relation":{},"subject":[],"published":{"date-parts":[[2024,10,8]]}}}