{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T07:46:12Z","timestamp":1764143172669,"version":"3.46.0"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T00:00:00Z","timestamp":1761004800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T00:00:00Z","timestamp":1761004800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,21]]},"DOI":"10.1109\/dft66274.2025.11257444","type":"proceedings-article","created":{"date-parts":[[2025,11,25]],"date-time":"2025-11-25T18:27:02Z","timestamp":1764095222000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["A Neural Network-Based Classifier for Glitch Detection in Clock Traces"],"prefix":"10.1109","author":[{"given":"Asier","family":"Gambra","sequence":"first","affiliation":[{"name":"Radboud University,Nijmegen,The Netherlands"}]},{"given":"Durba","family":"Chatterjee","sequence":"additional","affiliation":[{"name":"Radboud University,Nijmegen,The Netherlands"}]},{"given":"Unai","family":"Rioja","sequence":"additional","affiliation":[{"name":"Ikerlan Technology Research Centre,Mondragón,Spain"}]},{"given":"Igor","family":"Armendariz","sequence":"additional","affiliation":[{"name":"Ikerlan Technology Research Centre,Mondragón,Spain"}]},{"given":"Lejla","family":"Batina","sequence":"additional","affiliation":[{"name":"Radboud University,Nijmegen,The Netherlands"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-69053-0_4"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/bfb0052259"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-45203-4_23"},{"journal-title":"Tech. Rep. FIPS PUB 197, U.S. Department of Commerce","article-title":"Advanced Encryption Standard (AES)","year":"2001","key":"ref4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-12510-2_13"},{"key":"ref6","article-title":"Attacking Hardware AES with DFA","author":"Lu","year":"2019","journal-title":"ArXiv"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2012.15"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2019.8741030"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC60478.2023.00014"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2024.i1.157-179"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MIPRO.2014.6859734"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-90553-8_7"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-36400-5_20"},{"key":"ref14","first-page":"810","article-title":"Fault Injection using Crowbars on Embedded Systems","volume":"2016","author":"O\u2019Flynn","year":"2016","journal-title":"IACR Cryptol. ePrint Arch."},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2019.i2.199-224"},{"key":"ref16","first-page":"6239","article-title":"Oops. . ! I Glitched It Again! How to Multi-Glitch the Glitching-Protections on ARM TrustZone-M","volume-title":"32nd USENIX Security Symposium (USENIX Security 23)","author":"SaB","year":"2023"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3569577"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-49445-6_1"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s13389-019-00220-8"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.21314\/jcf.2019.358"},{"journal-title":"STM32 Nucleo-64 Development Board with STM32F410RB MCU","year":"2024","key":"ref21"},{"journal-title":"Inspector FI","key":"ref22"},{"volume-title":"Tiny AES in C - small portable AES implementation","year":"2024","key":"ref23"}],"event":{"name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2025,10,21]]},"location":"Barcelona, Spain","end":{"date-parts":[[2025,10,23]]}},"container-title":["2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11253546\/11257433\/11257444.pdf?arnumber=11257444","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T07:41:50Z","timestamp":1764142910000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11257444\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,21]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/dft66274.2025.11257444","relation":{},"subject":[],"published":{"date-parts":[[2025,10,21]]}}}