{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T19:04:25Z","timestamp":1764183865228,"version":"3.46.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T00:00:00Z","timestamp":1761004800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T00:00:00Z","timestamp":1761004800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62171313"],"award-info":[{"award-number":["62171313"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,21]]},"DOI":"10.1109\/dft66274.2025.11257497","type":"proceedings-article","created":{"date-parts":[[2025,11,25]],"date-time":"2025-11-25T18:27:02Z","timestamp":1764095222000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Dependability Analysis and Assessment of Approximate Membership Query XOR Filters"],"prefix":"10.1109","author":[{"given":"Jinhua","family":"Zhu","sequence":"first","affiliation":[{"name":"School of Integrated Circuit Science and Engineering, Tianjin University of Technology,Tianjin,China,300384"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhen","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University,Tianjin,China,300072"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pedro","family":"Reviriego","sequence":"additional","affiliation":[{"name":"Escuela Técnica Superior de Ingeniería de Telecomunicación, Universidad Politécnica de Madrid,Departamento de Ingeniería de Sistemas Telemáticos,Madrid,Spain,28040"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shanshan","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Information and Communication Engineering, University of Electronic Science and Technology of China,Chengdu,China,611731"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fabrizio","family":"Lombardi","sequence":"additional","affiliation":[{"name":"Northeastern University,Department of Electrical and Computer Engineering,Boston,MA,USA,02215"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2022.3221111"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICSC50631.2021.00010"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2022.3199646"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/362686.362692"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.14778\/3523210.3523211"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2021.3062182"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2674005.2674994"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3376122"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-16-4016-2_8"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICoICT58202.2023.10262536"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/iSemantic55962.2022.9920402"},{"key":"ref12","article-title":"GPU-accelerated Perfect Hash Construction: Parallel Implementation ofthe BDZ Algorithm and Application to Xor Filters","author":"Chua","year":"2023","journal-title":"Harvard University Division of Continuing Education"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2023.3284991"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3119462"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2024.3375125"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3101720"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2021.3067451"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2021.3101853"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2015.7315140"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2017.2702174"}],"event":{"name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2025,10,21]]},"location":"Barcelona, Spain","end":{"date-parts":[[2025,10,23]]}},"container-title":["2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11253546\/11257433\/11257497.pdf?arnumber=11257497","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T19:00:33Z","timestamp":1764183633000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11257497\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,21]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/dft66274.2025.11257497","relation":{},"subject":[],"published":{"date-parts":[[2025,10,21]]}}}