{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T07:56:43Z","timestamp":1764143803273,"version":"3.46.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T00:00:00Z","timestamp":1761004800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,21]],"date-time":"2025-10-21T00:00:00Z","timestamp":1761004800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,21]]},"DOI":"10.1109\/dft66274.2025.11257570","type":"proceedings-article","created":{"date-parts":[[2025,11,25]],"date-time":"2025-11-25T18:27:02Z","timestamp":1764095222000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Low Overhead Self-Correction in Radiation-Hardening-by-Design Triple Modular Redundancy Flip-Flops for Space Applications"],"prefix":"10.1109","author":[{"given":"Oliver","family":"Schrape","sequence":"first","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany,15236"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anselm","family":"Breitenreiter","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany,15236"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li","family":"Lu","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany,15236"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marko","family":"Andjelkovi\u0107","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany,15236"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ernesto","family":"Pun-Garcia","sequence":"additional","affiliation":[{"name":"Arquimea Research Center,Torrejón de Ardoz,Spain,28850"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marisa","family":"L\u00f3pez-Vallejo","sequence":"additional","affiliation":[{"name":"IPTC, ETSI Telecomunicación, Universidad Politécnica de Madrid,Madrid,Spain,28040"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Milo\u0161","family":"Krsti\u0107","sequence":"additional","affiliation":[{"name":"IHP - Leibniz Institute for High Performance Microelectronics,Frankfurt (Oder),Germany,15236"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS50870.2020.9159716"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/BEC.2018.8600987"},{"key":"ref3","article-title":"Physical and Silicon Measures of Low Power Clock Gating Success: An Apple to Apple Case Study","author":"Pokhrel","year":"2007","journal-title":"SNUG"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2262002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-1887-4"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2015.65"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MIEL52794.2021.9569065"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2019.00100"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3109080"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/lascas51355.2021.9459134"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DSD51259.2020.00101"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052831"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/4.16303"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DCIS58620.2023.10335985"},{"key":"ref16","first-page":"4","article-title":"A Self-Correcting Soft Error Tolerant Flip-Flop","volume-title":"12th NASA Symposium on VLSI Design, Coeur d\u2019Alene","author":"Drake","year":"2005"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2009.5994697"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2169280"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2017.8696212"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/NorCAS64408.2024.10752481"},{"key":"ref21","article-title":"Research on ADC Architectures Suitable for Space Applications and Technology Scaling","volume-title":"International Workshop on Analogue and Mixed-Signal Integrated Circuits for Space Applications (AMICSA)","author":"Garcia","year":"2021"}],"event":{"name":"2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2025,10,21]]},"location":"Barcelona, Spain","end":{"date-parts":[[2025,10,23]]}},"container-title":["2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11253546\/11257433\/11257570.pdf?arnumber=11257570","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T07:52:35Z","timestamp":1764143555000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11257570\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,21]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/dft66274.2025.11257570","relation":{},"subject":[],"published":{"date-parts":[[2025,10,21]]}}}