{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T13:20:21Z","timestamp":1742390421808,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/dftvs.2002.1173499","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T21:03:42Z","timestamp":1056575022000},"page":"31-39","source":"Crossref","is-referenced-by-count":1,"title":["A simplified gate-level fault model for crosstalk effects analysis"],"prefix":"10.1109","author":[{"given":"P.","family":"Civera","sequence":"first","affiliation":[]},{"given":"L.","family":"Macchiarulo","sequence":"additional","affiliation":[]},{"given":"M.","family":"Violante","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/43.594834"},{"article-title":"Experimental Analysis of Computer System Dependability","year":"1996","author":"iyer","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1994.315656"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/54.544533"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"1447","DOI":"10.1109\/43.97624","article-title":"FastCap: a Multipole Accellerated 3-D Capacitance Extraction Program","volume":"10","author":"nahors","year":"1991","journal-title":"IEEE Trans on CAD"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/22.310584"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/378239.379055"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.156230"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASIC.1999.806514"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2000.838935"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.845079"},{"key":"ref7","article-title":"Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysys","author":"agarwal","year":"2002","journal-title":"VLSID '02 Proceedings of the 15th International Conference on VLSI Design"},{"key":"ref2","first-page":"331","article-title":"Switching window computation for static timing analysis in presence of crosstalk noise","author":"chen","year":"2000","journal-title":"IEEE\/ACM International Conference on Computer Aided Design"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.156231"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.156219"}],"event":{"name":"17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002","acronym":"DFTVS-02","location":"Vancouver, BC, Canada"},"container-title":["17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8374\/26363\/01173499.pdf?arnumber=1173499","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T18:46:01Z","timestamp":1497552361000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1173499\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/dftvs.2002.1173499","relation":{},"subject":[]}}