{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T05:00:14Z","timestamp":1725426014522},"reference-count":12,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/dftvs.2002.1173504","type":"proceedings-article","created":{"date-parts":[[2003,6,26]],"date-time":"2003-06-26T01:03:42Z","timestamp":1056589422000},"page":"78-86","source":"Crossref","is-referenced-by-count":1,"title":["Partially duplicated code-disjoint carry-skip adder"],"prefix":"10.1109","author":[{"given":"D.","family":"Marienfeld","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Ocheretnij","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Gossel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.S.","family":"Sogomonyan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Self-Checking and Fault-Tolerant Digital Design","year":"2001","author":"lala","key":"ref4"},{"key":"ref3","first-page":"460","article-title":"A Tool for Generation of Self-Checking Data Paths","author":"hambi","year":"1995","journal-title":"Proceedings of 13th IEEE VLSI Test Symposium"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1987.1676855"},{"journal-title":"Computer Arithmetic Algorithms","year":"2002","author":"koren","key":"ref6"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2002.1030181"},{"journal-title":"Computer Arithmetic Algorithms and Hardware Designs","year":"2000","author":"parhami","key":"ref5"},{"journal-title":"Error Detection Logic for Digital Computers","year":"1968","author":"sellers","key":"ref12"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/12.277297"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/12.156534"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843827"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/12.247841"},{"journal-title":"Application-Specific Integrated Circuits","year":"1997","author":"smith","key":"ref1"}],"event":{"name":"17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002","acronym":"DFTVS-02","location":"Vancouver, BC, Canada"},"container-title":["17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8374\/26363\/01173504.pdf?arnumber=1173504","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T23:06:55Z","timestamp":1489446415000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1173504\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/dftvs.2002.1173504","relation":{},"subject":[]}}