{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T21:58:31Z","timestamp":1725659911353},"reference-count":15,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/dftvs.2002.1173514","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T21:03:42Z","timestamp":1056575022000},"page":"177-185","source":"Crossref","is-referenced-by-count":5,"title":["Fortuitous detection and its impact on test set sizes using stuck-at and transition faults"],"prefix":"10.1109","author":[{"given":"J.","family":"Dworak","sequence":"first","affiliation":[]},{"given":"J.","family":"Wingfield","sequence":"additional","affiliation":[]},{"given":"B.","family":"Cobb","sequence":"additional","affiliation":[]},{"family":"Sooryong Lee","sequence":"additional","affiliation":[]},{"given":"L.-C.","family":"Wang","sequence":"additional","affiliation":[]},{"given":"M.R.","family":"Mercer","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"168","article-title":"The Effectiveness of IDDQ, Functional, and Scan Tests: How Many Fault Coverages Do We Need?","author":"maxwell","year":"1998","journal-title":"Proc International Test Conference"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1974.224020"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207864"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/43.833205"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923462"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743256"},{"key":"ref4","first-page":"268","article-title":"REDO-Random Excitation and Deterministic Observation-First Commercial Experiment","author":"grimaila","year":"1999","journal-title":"Proc VLSI Test Symposium"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/54.902820"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1993.627322"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/43.856980"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529895"},{"key":"ref7","first-page":"94","article-title":"A new ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detection of All Faults","author":"lee","year":"2002","journal-title":"Proc Design Automation and Test in Europe"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1990.114938"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1986.1676819"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805783"}],"event":{"name":"17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002","acronym":"DFTVS-02","location":"Vancouver, BC, Canada"},"container-title":["17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8374\/26363\/01173514.pdf?arnumber=1173514","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T19:02:02Z","timestamp":1489431722000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1173514\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/dftvs.2002.1173514","relation":{},"subject":[]}}