{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T11:59:44Z","timestamp":1725451184883},"reference-count":16,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/dftvs.2002.1173516","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T21:03:42Z","timestamp":1056575022000},"page":"195-203","source":"Crossref","is-referenced-by-count":1,"title":["Testing digital circuits with constraints"],"prefix":"10.1109","author":[{"given":"A.A.","family":"Al-Yamani","sequence":"first","affiliation":[]},{"given":"S.","family":"Mitra","sequence":"additional","affiliation":[]},{"given":"E.J.","family":"McCluskey","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"32","article-title":"An Enhancement to LSSD and some Applications of LSSD in Reliability, Availability and Serviceability","author":"das gupta","year":"1981","journal-title":"Proc International Symposium on Fault-Tolerant Computing"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529855"},{"key":"ref12","first-page":"137","article-title":"DFT Advances in the Motorola's MPC7400, a PowerPCTM G4 Microprocessor","author":"pyron","year":"1999","journal-title":"Proc International Test Conference"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1997.600311"},{"journal-title":"Design for At-Speed Test Diagnosis And Measurement","year":"2000","key":"ref14"},{"journal-title":"Benchmark Suite for ITC","year":"1999","key":"ref15"},{"journal-title":"CRC Technical Report 02–2","article-title":"Testing Digital Circuits with Constraints","year":"2002","key":"ref16"},{"key":"ref4","first-page":"131","article-title":"DFT Advances in Motorola's Next-Generation 74xx PowerPCTM Microprocessor","author":"raina","year":"2000","journal-title":"Proc International Test Conf"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"journal-title":"Scan Synthesis User Guide Synopsys","year":"1997","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805812"},{"article-title":"Local tristate control circuit","year":"1992","author":"fleming","key":"ref8"},{"key":"ref7","first-page":"157","article-title":"Testability, Debuggability, and Manufacturability Features of the UltraSPARC TM-I Microprocessor","author":"levitt","year":"1995","journal-title":"Proc International Test Conference"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1985.294856"},{"journal-title":"Logic Design Principles with Emphasis on Testable Semicustom Circuits","year":"1986","author":"mc cluskey","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639684"}],"event":{"name":"17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002","acronym":"DFTVS-02","location":"Vancouver, BC, Canada"},"container-title":["17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8374\/26363\/01173516.pdf?arnumber=1173516","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T19:12:21Z","timestamp":1489432341000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1173516\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/dftvs.2002.1173516","relation":{},"subject":[]}}