{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,11]],"date-time":"2025-06-11T05:25:35Z","timestamp":1749619535166,"version":"3.28.0"},"reference-count":16,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/dftvs.2002.1173518","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T21:03:42Z","timestamp":1056575022000},"page":"216-224","source":"Crossref","is-referenced-by-count":4,"title":["Self-checking and fault tolerance quality assessment using fault sampling"],"prefix":"10.1109","author":[{"given":"F.M.","family":"Goncalves","sequence":"first","affiliation":[]},{"given":"M.B.","family":"Santos","sequence":"additional","affiliation":[]},{"given":"I.C.","family":"Teixeira","sequence":"additional","affiliation":[]},{"given":"J.P.","family":"Teixeira","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1993.470717"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1991.164111"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/BF00133503"},{"key":"ref13","first-page":"189","article-title":"Sampling Techniques for Determining Fault Coverage in LSI Circuits","volume":"v","author":"agrawal","year":"1981","journal-title":"Journal of Digital Systems"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/41.19063"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"41","DOI":"10.1023\/A:1008351310657","article-title":"Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems","volume":"15","author":"gon\u00e7alves","year":"1999","journal-title":"Journal of Electronic Testing Theory and Applications (JETTA)"},{"key":"ref16","first-page":"35","article-title":"Defect-Oriented Test Quality Assessment Using Fault Sampling and Simulation","author":"gon\u00e7alves","year":"1998","journal-title":"Proc Int Test Conf (ITC)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/43.277640"},{"journal-title":"Error Detecting Codes Self-Checking Circuits and Applications","year":"1978","author":"wakerly","key":"ref3"},{"key":"ref6","first-page":"672","article-title":"Finite State Machine Synthesis with Concurrent Error Detection","author":"zeng","year":"1999","journal-title":"Proc Int Test Conf (ITC)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/BF00993127"},{"year":"1993","key":"ref8","article-title":"EN 298 - Automatic Gas Burner Control Systems for Gas Burners and Gas Burning Appliances with or without Fans"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894311"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4613-1525-4","article-title":"Testing and Reliable Design of CMOS Circuits","author":"jha","year":"1990"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/43.229762"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"285","DOI":"10.1023\/A:1015083105421","article-title":"Design and Test of a Certifiable ASIC for Safety-critical Gas Burners Control System","volume":"18","author":"gon\u00e7alves","year":"2002","journal-title":"Journal of Electronic Testing Theory and Application (JETTA)"}],"event":{"name":"17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002","acronym":"DFTVS-02","location":"Vancouver, BC, Canada"},"container-title":["17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8374\/26363\/01173518.pdf?arnumber=1173518","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T18:46:01Z","timestamp":1497552361000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1173518\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/dftvs.2002.1173518","relation":{},"subject":[]}}