{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,31]],"date-time":"2025-10-31T17:09:16Z","timestamp":1761930556488,"version":"build-2065373602"},"reference-count":17,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/dftvs.2002.1173522","type":"proceedings-article","created":{"date-parts":[[2003,6,26]],"date-time":"2003-06-26T01:03:42Z","timestamp":1056589422000},"page":"254-262","source":"Crossref","is-referenced-by-count":5,"title":["A fault hypothesis study on the TTP\/C using VHDL-based and pin-level fault injection techniques"],"prefix":"10.1109","author":[{"given":"S.","family":"Blanc","sequence":"first","affiliation":[]},{"given":"J.","family":"Gracia","sequence":"additional","affiliation":[]},{"given":"P.J.","family":"Gil","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2001.966775"},{"key":"ref11","first-page":"73","article-title":"A Study of the Effects of Transient Fault Injection into the VHDL Model of a Fault-Tolerant Microcomputer System","author":"gil","year":"2000","journal-title":"Procs 6th IEEE International On-Line Testing Workshop (IOLTW 2000)"},{"key":"ref12","first-page":"408","article-title":"A Distributed Simulation Environment for Fault Injection Analysis on SOC Models","author":"rodriguez","year":"2002","journal-title":"Proc of IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DCFTS.1999.814299"},{"key":"ref14","first-page":"412","article-title":"Three Different Fault Injection Techniques Combined to Improve the Detection Efficiency for Time-Triggered Systems","author":"blanc","year":"2002","journal-title":"Proc of IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS)"},{"key":"ref15","first-page":"259","article-title":"Stratified Fault Injection using Hardware and Software-implemented Tools","author":"blanc","year":"2001","journal-title":"Proc of IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2001.996386"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0019-9958(84)80033-9"},{"year":"1999","key":"ref4","article-title":"TTP\/C C1 Controller. Version 1.0"},{"key":"ref3","first-page":"8","article-title":"Bus Architectures For Safety-Critical Embedded Systems","author":"rushby","year":"2001","journal-title":"Proceedings of the First Workshop on Embedded Software (EMSOFT 2001)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICDSN.2000.857508"},{"key":"ref5","article-title":"Design of a Centralized Bus Guardian for the Time-Triggered Protocol Class C","author":"jonhson","year":"2000","journal-title":"Technical Report 9\/2000"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S1383-7621(01)00036-4"},{"key":"ref7","article-title":"A Comparison of TTP\/C and FlexRay","author":"kopetz","year":"2001","journal-title":"Research Report 10\/2001"},{"journal-title":"SAE Handbook","article-title":"Class C application requirements-J2056\/1","year":"1994","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/23.903813"},{"year":"2001","key":"ref9","article-title":"Modelsim SE User's Manual. Version 5.5e"}],"event":{"name":"17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002","acronym":"DFTVS-02","location":"Vancouver, BC, Canada"},"container-title":["17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8374\/26363\/01173522.pdf?arnumber=1173522","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T22:22:11Z","timestamp":1489443731000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1173522\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/dftvs.2002.1173522","relation":{},"subject":[]}}