{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T13:11:57Z","timestamp":1725801117033},"reference-count":9,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/dftvs.2003.1250092","type":"proceedings-article","created":{"date-parts":[[2004,3,2]],"date-time":"2004-03-02T02:26:50Z","timestamp":1078194410000},"page":"26-33","source":"Crossref","is-referenced-by-count":20,"title":["Calibration of open interconnect yield models"],"prefix":"10.1109","author":[{"given":"D.K.","family":"de Vries","sequence":"first","affiliation":[]},{"given":"P.L.C.","family":"Simon","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Yield modeling for deep sub-micron IC design","year":"2001","author":"simon","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1995.476934"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/43.743724"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/66.661294"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/66.311339"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/43.920683"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1985.1270112"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2002.1001579"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/0026-2692(89)90127-4"}],"event":{"name":"18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","acronym":"DFTVS-03","location":"Boston, MA, USA"},"container-title":["Proceedings. 16th IEEE Symposium on Computer Arithmetic"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8839\/27973\/01250092.pdf?arnumber=1250092","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T18:32:56Z","timestamp":1489429976000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1250092\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/dftvs.2003.1250092","relation":{},"subject":[]}}