{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T01:06:22Z","timestamp":1725498382209},"reference-count":9,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/dftvs.2003.1250111","type":"proceedings-article","created":{"date-parts":[[2004,3,2]],"date-time":"2004-03-02T02:26:50Z","timestamp":1078194410000},"page":"185-190","source":"Crossref","is-referenced-by-count":0,"title":["Test compaction by using linear-matrix driven scan chains"],"prefix":"10.1109","author":[{"given":"S.","family":"Bhatia","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041773"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743304"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1188267"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041775"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966672"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197655"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1997.643974"},{"article-title":"Build-in test for VLSI: pseudorandom techniques","year":"1987","author":"bardell","key":"ref9"},{"key":"ref1","first-page":"120","article-title":"Generation of vector patterns through reseeding of multiple-polynomial linear feedback shift register","author":"hellebrand","year":"1992","journal-title":"Proc International Test Conference"}],"event":{"name":"18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","acronym":"DFTVS-03","location":"Boston, MA, USA"},"container-title":["Proceedings. 16th IEEE Symposium on Computer Arithmetic"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8839\/27973\/01250111.pdf?arnumber=1250111","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T19:38:02Z","timestamp":1489433882000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1250111\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/dftvs.2003.1250111","relation":{},"subject":[]}}