{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T10:14:23Z","timestamp":1773656063693,"version":"3.50.1"},"reference-count":29,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/dftvs.2003.1250139","type":"proceedings-article","created":{"date-parts":[[2004,3,1]],"date-time":"2004-03-01T21:26:50Z","timestamp":1078176410000},"page":"417-424","source":"Crossref","is-referenced-by-count":6,"title":["Automatic modification of sequential circuits for self-checking implementation"],"prefix":"10.1109","author":[{"given":"C.","family":"Metra","sequence":"first","affiliation":[]},{"given":"S.","family":"Di Francescantonio","sequence":"additional","affiliation":[]},{"given":"M.","family":"Omana","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1997.628336"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313309"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2001.937839"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2001.934195"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998396"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1988.5324"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1982.4336490"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/43.644039"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/el:19941351"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1995.476963"},{"key":"ref28","first-page":"56","article-title":"Design or Self-Cneckmg Combinational Circuits with Low Area Overhead","author":"saposhnikov","year":"1996","journal-title":"Proc of 2nd IEEE Int On-Line Testing Work"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/2.803640"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/12.238498"},{"key":"ref3","year":"0"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223705"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675139"},{"key":"ref5","article-title":"Design of self-checking digital network using coding techniques","author":"anderson","year":"1971","journal-title":"Tech Report R-527 CSL Univ of Illinois IL"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S0019-9958(61)80037-5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1977.1674911"},{"key":"ref2","year":"0","journal-title":"Autologic User Manual Mentor Graphics"},{"key":"ref9","first-page":"47","article-title":"The Architecture of the Fail-Stop Controller AE11","author":"bohl","year":"1997","journal-title":"Proc of the IEEE International On-Line Testing Workshop"},{"key":"ref1","article-title":"International Technology Roadmap for Semiconductors","year":"2001"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2002.1173517"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/12.2217"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008369203223"},{"key":"ref24","doi-asserted-by":"crossref","DOI":"10.1109\/OLT.2003.1214376","article-title":"A Model for Transient Fault Propagaion in Combinatorial Logic","author":"oma\u00f1a","year":"2003","journal-title":"to be published in Proc of IEEE Int On-Line Testing Symp"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.1999.761107"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2002.1173532"},{"key":"ref25","article-title":"Design of self-testing checkers for unidirectional error detecting codes","author":"piestrak","year":"1995","journal-title":"Monographs"}],"event":{"name":"18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","location":"Boston, MA, USA","acronym":"DFTVS-03"},"container-title":["Proceedings. 16th IEEE Symposium on Computer Arithmetic"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8839\/27973\/01250139.pdf?arnumber=1250139","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,4,21]],"date-time":"2018-04-21T10:25:47Z","timestamp":1524306347000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1250139\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/dftvs.2003.1250139","relation":{},"subject":[]}}