{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T06:04:17Z","timestamp":1725689057725},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.1109\/drc.2018.8442167","type":"proceedings-article","created":{"date-parts":[[2018,9,7]],"date-time":"2018-09-07T14:52:02Z","timestamp":1536331922000},"page":"1-2","source":"Crossref","is-referenced-by-count":1,"title":["All MOCVD grown 250 nm gate length Al<sub>0.70<\/sub>Ga<sub>0.30<\/sub>N MESFETs"],"prefix":"10.1109","author":[{"given":"Hao","family":"Xue","sequence":"first","affiliation":[]},{"given":"Towhidur","family":"Razzak","sequence":"additional","affiliation":[]},{"given":"Seongmo","family":"Hwang","sequence":"additional","affiliation":[]},{"given":"Antwon","family":"Coleman","sequence":"additional","affiliation":[]},{"given":"Sanyam","family":"Bajaj","sequence":"additional","affiliation":[]},{"given":"Yuewei","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Zane","family":"Jamal-Eddin","sequence":"additional","affiliation":[]},{"given":"Shahadat Hasan","family":"Sohel","sequence":"additional","affiliation":[]},{"given":"Asif","family":"Khan","sequence":"additional","affiliation":[]},{"given":"Siddharth","family":"Rajan","sequence":"additional","affiliation":[]},{"given":"Wu","family":"Lu","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"2018 76th Device Research Conference (DRC)","start":{"date-parts":[[2018,6,24]]},"location":"Santa Barbara, CA","end":{"date-parts":[[2018,6,27]]}},"container-title":["2018 76th Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8424808\/8442143\/08442167.pdf?arnumber=8442167","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,20]],"date-time":"2019-06-20T23:02:34Z","timestamp":1561071754000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8442167\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/drc.2018.8442167","relation":{},"subject":[],"published":{"date-parts":[[2018,6]]}}}