{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:17:23Z","timestamp":1730215043477,"version":"3.28.0"},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.1109\/drc.2018.8442214","type":"proceedings-article","created":{"date-parts":[[2018,9,7]],"date-time":"2018-09-07T14:52:02Z","timestamp":1536331922000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["High Voltage Vertical Gallium Nitride Pseudo-Junction-Barrier-Schottky Diode with Ion Implantation"],"prefix":"10.1109","author":[{"given":"Sizhen","family":"Wang","sequence":"first","affiliation":[]},{"given":"Alex Q.","family":"Huang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"DE-FOA-0001691 (PNDIODES)","year":"2016","key":"ref4"},{"key":"ref3","first-page":"9. 7. 1","author":"nomoto","year":"2015","journal-title":"IEDM"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"183502","DOI":"10.1063\/1.4919866","volume":"106","author":"yeluri","year":"2015","journal-title":"Appl Phys Lett"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"414","DOI":"10.1109\/TED.2014.2360861","volume":"62","author":"kizilyalli","year":"0","journal-title":"IEEE TED"},{"key":"ref1","first-page":"10q","volume":"6","author":"koehler","year":"2017","journal-title":"ECSJSSST"}],"event":{"name":"2018 76th Device Research Conference (DRC)","start":{"date-parts":[[2018,6,24]]},"location":"Santa Barbara, CA","end":{"date-parts":[[2018,6,27]]}},"container-title":["2018 76th Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8424808\/8442143\/08442214.pdf?arnumber=8442214","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,23]],"date-time":"2020-08-23T23:45:05Z","timestamp":1598226305000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8442214\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/drc.2018.8442214","relation":{},"subject":[],"published":{"date-parts":[[2018,6]]}}}