{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:17:36Z","timestamp":1730215056972,"version":"3.28.0"},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.1109\/drc.2018.8442248","type":"proceedings-article","created":{"date-parts":[[2018,9,7]],"date-time":"2018-09-07T18:52:02Z","timestamp":1536346322000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["Fabrication and Characterization of a Fully Si Compatible Forming-Free GeO<sub>x<\/sub>Resistive Switching Random-Access Memory"],"prefix":"10.1109","author":[{"given":"Jae Yoon","family":"Lee","sequence":"first","affiliation":[]},{"given":"Youngmin","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Ikhyeon","family":"Kworn","sequence":"additional","affiliation":[]},{"given":"Il Hwan","family":"Cho","sequence":"additional","affiliation":[]},{"given":"Jae Yeon","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Soo Gil","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Seongjae","family":"Cho","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","volume":"12","author":"fang","year":"2005","journal-title":"Proc MEMS 2005"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"73716","DOI":"10.1063\/1.3234395","volume":"106","author":"sasada","year":"2015","journal-title":"J Appl Phys"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"1951","DOI":"10.1109\/JPROC.2012.2190369","volume":"100","author":"wong","year":"2015","journal-title":"Proc IEEE"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1186\/1556-276X-8-418"}],"event":{"name":"2018 76th Device Research Conference (DRC)","start":{"date-parts":[[2018,6,24]]},"location":"Santa Barbara, CA","end":{"date-parts":[[2018,6,27]]}},"container-title":["2018 76th Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8424808\/8442143\/08442248.pdf?arnumber=8442248","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,23]],"date-time":"2020-08-23T23:55:30Z","timestamp":1598226930000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8442248\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/drc.2018.8442248","relation":{},"subject":[],"published":{"date-parts":[[2018,6]]}}}