{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,2]],"date-time":"2025-09-02T00:04:07Z","timestamp":1756771447931,"version":"3.44.0"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/drc46940.2019.9046388","type":"proceedings-article","created":{"date-parts":[[2020,3,27]],"date-time":"2020-03-27T06:01:07Z","timestamp":1585288867000},"page":"145-146","source":"Crossref","is-referenced-by-count":0,"title":["Pulsed characteristics for high current, large area GaN\/Ain resonant tunneling diodes"],"prefix":"10.1109","author":[{"given":"T.A.","family":"Growden","sequence":"first","affiliation":[{"name":"NAS-NRC Postdoctoral Fellow at U.S. Naval Research Laboratory,Washington, DC,USA,20375"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.F.","family":"Storm","sequence":"additional","affiliation":[{"name":"U.S. Naval Research Laboratory, Code 6852,4555 Overlook Ave. SW,Washington, DC,USA,20375"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.M.","family":"Cornuelle","sequence":"additional","affiliation":[{"name":"Ohio State Univ.,Dept. of Electrical and Computer Engineering,2015 Neil Ave., Columbus,OH,USA,43210"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.M","family":"Whitaker","sequence":"additional","affiliation":[{"name":"Ohio State Univ.,Dept. of Electrical and Computer Engineering,2015 Neil Ave., Columbus,OH,USA,43210"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B.P.","family":"Downey","sequence":"additional","affiliation":[{"name":"U.S. Naval Research Laboratory, Code 6852,4555 Overlook Ave. SW,Washington, DC,USA,20375"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W-D.","family":"Zhang","sequence":"additional","affiliation":[{"name":"Wright State Univ.,Dept. of Physics,3640 Colonel Glenn Hwy., Dayton,OH,USA,45435"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.W.","family":"Daulton","sequence":"additional","affiliation":[{"name":"Lincoln Laboratory, Massachusetts Institute of Technology,244 Wood St., Lexington,MA,USA,02421"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Molnar","sequence":"additional","affiliation":[{"name":"Lincoln Laboratory, Massachusetts Institute of Technology,244 Wood St., Lexington,MA,USA,02421"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.R.","family":"Brown","sequence":"additional","affiliation":[{"name":"Wright State Univ.,Dept. of Physics,3640 Colonel Glenn Hwy., Dayton,OH,USA,45435"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.R.","family":"Berger","sequence":"additional","affiliation":[{"name":"Ohio State Univ.,Dept. of Electrical and Computer Engineering,2015 Neil Ave., Columbus,OH,USA,43210"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.J.","family":"Meyer","sequence":"additional","affiliation":[{"name":"U.S. Naval Research Laboratory, Code 6852,4555 Overlook Ave. SW,Washington, DC,USA,20375"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201800651"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.5010794"},{"journal-title":"ATLAS [software]","year":"2016","author":"silvaco","key":"ref6"},{"journal-title":"Appl Phys Lett","year":"2019","author":"growden","key":"ref5"},{"key":"ref2","first-page":"41017","volume":"7","author":"encomendero","year":"2017","journal-title":"Phys Rev X"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4961442"}],"event":{"name":"2019 Device Research Conference (DRC)","start":{"date-parts":[[2019,6,23]]},"location":"Ann Arbor, MI, USA","end":{"date-parts":[[2019,6,26]]}},"container-title":["2019 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9038149\/9046332\/09046388.pdf?arnumber=9046388","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T19:27:07Z","timestamp":1756754827000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9046388\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/drc46940.2019.9046388","relation":{},"subject":[],"published":{"date-parts":[[2019,6]]}}}