{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:18:11Z","timestamp":1730215091629,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/drc46940.2019.9046421","type":"proceedings-article","created":{"date-parts":[[2020,3,27]],"date-time":"2020-03-27T06:01:07Z","timestamp":1585288867000},"page":"93-95","source":"Crossref","is-referenced-by-count":0,"title":["Modeling of Leakage-Assist-Switching in Ferroelectric\/Dielectric Stack"],"prefix":"10.1109","author":[{"given":"Mengwei","family":"Si","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiao","family":"Lyu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peide D.","family":"Ye","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"4318","DOI":"10.1021\/nl302049k","author":"muller","year":"2012","journal-title":"Nano Lett"},{"journal-title":"ArXiv","year":"2018","author":"si","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2612656"},{"key":"ref13","first-page":"224105","author":"kim","year":"2015","journal-title":"JAP"},{"key":"ref4","first-page":"481","author":"yoo","year":"2017","journal-title":"IEDM"},{"key":"ref3","first-page":"485","author":"dunkel","year":"2017","journal-title":"IEDM"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"24","DOI":"10.1038\/s41565-017-0010-1","volume":"13","author":"si","year":"2018","journal-title":"Nature Nanotech"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"405","DOI":"10.1021\/nl071804g","author":"salahuddin","year":"2008","journal-title":"Nano Lett"},{"key":"ref8","first-page":"306","author":"lee","year":"2016","journal-title":"IEDM"},{"key":"ref7","first-page":"620","author":"li","year":"2015","journal-title":"IEDM"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2177435"},{"key":"ref1","first-page":"102903","author":"boscke","year":"2011","journal-title":"APL"},{"key":"ref9","first-page":"357","author":"krivokanic","year":"2017","journal-title":"IEDM"}],"event":{"name":"2019 Device Research Conference (DRC)","start":{"date-parts":[[2019,6,23]]},"location":"Ann Arbor, MI, USA","end":{"date-parts":[[2019,6,26]]}},"container-title":["2019 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9038149\/9046332\/09046421.pdf?arnumber=9046421","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T17:52:59Z","timestamp":1658080379000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9046421\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/drc46940.2019.9046421","relation":{},"subject":[],"published":{"date-parts":[[2019,6]]}}}