{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T18:42:31Z","timestamp":1755801751846,"version":"3.44.0"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/drc46940.2019.9046470","type":"proceedings-article","created":{"date-parts":[[2020,3,27]],"date-time":"2020-03-27T06:01:07Z","timestamp":1585288867000},"page":"225-226","source":"Crossref","is-referenced-by-count":2,"title":["Enhancement-Mode Current Aperture Vertical Ga<sub>2<\/sub>O<sub>3<\/sub> MOSFETs"],"prefix":"10.1109","author":[{"given":"Man Hoi","family":"Wong","sequence":"first","affiliation":[{"name":"National Institute of Information and Communications Technology,Koganei,Tokyo,Japan,184\u20138795"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hisashi","family":"Murakami","sequence":"additional","affiliation":[{"name":"Tokyo University of Agriculture and Technology,Department of Applied Chemistry,Koganei,Tokyo,Japan,184\u20138588"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yoshinao","family":"Kumagai","sequence":"additional","affiliation":[{"name":"Tokyo University of Agriculture and Technology,Department of Applied Chemistry,Koganei,Tokyo,Japan,184\u20138588"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Masataka","family":"Higashiwaki","sequence":"additional","affiliation":[{"name":"National Institute of Information and Communications Technology,Koganei,Tokyo,Japan,184\u20138795"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.7567\/APEX.8.015503"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/LED.2018.2884542"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.tsf.2018.09.006"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1063\/1.5050040"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.7567\/APEX.6.086502"}],"event":{"name":"2019 Device Research Conference (DRC)","start":{"date-parts":[[2019,6,23]]},"location":"Ann Arbor, MI, USA","end":{"date-parts":[[2019,6,26]]}},"container-title":["2019 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9038149\/9046332\/09046470.pdf?arnumber=9046470","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T18:39:12Z","timestamp":1755715152000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9046470\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/drc46940.2019.9046470","relation":{},"subject":[],"published":{"date-parts":[[2019,6]]}}}