{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T01:02:44Z","timestamp":1725584564137},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/drc50226.2020.9135156","type":"proceedings-article","created":{"date-parts":[[2020,7,8]],"date-time":"2020-07-08T20:46:18Z","timestamp":1594241178000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["Multiplication characteristics of Al<sub>0.4<\/sub>Ga<sub>0.07<\/sub>In<sub>0.53<\/sub>As avalanche photodiodes grown as digital alloys on InP substrates"],"prefix":"10.1109","author":[{"given":"S.","family":"Lee","sequence":"first","affiliation":[]},{"given":"S. H.","family":"Kodati","sequence":"additional","affiliation":[]},{"given":"D. R.","family":"Fink","sequence":"additional","affiliation":[]},{"given":"T. J.","family":"Ronningen","sequence":"additional","affiliation":[]},{"given":"A. H.","family":"Jones","sequence":"additional","affiliation":[]},{"given":"J. C.","family":"Campbell","sequence":"additional","affiliation":[]},{"given":"M.","family":"Winslow","sequence":"additional","affiliation":[]},{"given":"C. H.","family":"Grein","sequence":"additional","affiliation":[]},{"given":"S.","family":"Krishna","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.112427"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.5040592"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.101699"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41566-019-0477-4"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4942372"}],"event":{"name":"2020 Device Research Conference (DRC)","start":{"date-parts":[[2020,6,21]]},"location":"Columbus, OH, USA","end":{"date-parts":[[2020,6,24]]}},"container-title":["2020 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9132184\/9135142\/09135156.pdf?arnumber=9135156","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:58:01Z","timestamp":1656345481000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9135156\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/drc50226.2020.9135156","relation":{},"subject":[],"published":{"date-parts":[[2020,6]]}}}