{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,30]],"date-time":"2025-09-30T10:51:47Z","timestamp":1759229507408},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/drc50226.2020.9135172","type":"proceedings-article","created":{"date-parts":[[2020,7,8]],"date-time":"2020-07-08T20:46:18Z","timestamp":1594241178000},"page":"1-2","source":"Crossref","is-referenced-by-count":3,"title":["Polarization-induced Strain-coupled TMD FETs (PS FETs) for Non-Volatile Memory Applications"],"prefix":"10.1109","author":[{"given":"Niharika","family":"Thakuria","sequence":"first","affiliation":[]},{"given":"Atanu K.","family":"Saha","sequence":"additional","affiliation":[]},{"given":"Sandeep K.","family":"Thirumala","sequence":"additional","affiliation":[]},{"given":"Daniel","family":"Schulman","sequence":"additional","affiliation":[]},{"given":"Saptarshi","family":"Das","sequence":"additional","affiliation":[]},{"given":"Sumeet K.","family":"Gupta","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"EDL","year":"2016","author":"aziz","key":"ref10"},{"journal-title":"S2DS Model","year":"0","author":"suryavanshi","key":"ref11"},{"journal-title":"ISCAS","year":"2016","author":"gupta","key":"ref12"},{"journal-title":"Digital Integrated Circuits","year":"0","author":"rabey","key":"ref13"},{"journal-title":"Proc IEEE Conf Nano Tech","year":"2019","author":"kirbach","key":"ref14"},{"journal-title":"Adv Funct Mater","year":"2017","author":"yu","key":"ref15"},{"journal-title":"Nano Lett","year":"2016","author":"english","key":"ref16"},{"journal-title":"DRC","year":"2018","author":"thirumala","key":"ref17"},{"journal-title":"IEEE EDL","year":"2002","author":"ma","key":"ref4"},{"journal-title":"ISQED March","year":"2017","author":"gupta","key":"ref3"},{"journal-title":"ACS Nano Lett","year":"2015","author":"alveraz","key":"ref6"},{"journal-title":"IEEE TED","year":"2017","author":"khan","key":"ref5"},{"journal-title":"Nat Comm","year":"2014","author":"nayak","key":"ref8"},{"journal-title":"APL","year":"2103","author":"malakooti","key":"ref7"},{"journal-title":"Nature Mater","year":"2012","author":"bibes","key":"ref2"},{"journal-title":"ESSDERC","year":"2015","author":"chen","key":"ref1"},{"journal-title":"Adv Funct Mater","year":"2012","author":"newns","key":"ref9"}],"event":{"name":"2020 Device Research Conference (DRC)","start":{"date-parts":[[2020,6,21]]},"location":"Columbus, OH, USA","end":{"date-parts":[[2020,6,24]]}},"container-title":["2020 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9132184\/9135142\/09135172.pdf?arnumber=9135172","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:58:01Z","timestamp":1656345481000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9135172\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/drc50226.2020.9135172","relation":{},"subject":[],"published":{"date-parts":[[2020,6]]}}}