{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:18:37Z","timestamp":1730215117223,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/drc50226.2020.9135187","type":"proceedings-article","created":{"date-parts":[[2020,7,8]],"date-time":"2020-07-08T20:46:18Z","timestamp":1594241178000},"page":"1-2","source":"Crossref","is-referenced-by-count":1,"title":["Understanding of Multiple Resistance States by Current-sweep Measurement and Compliance Current Modulation in 2D MoS<sub>2<\/sub>-based Non-volatile Resistance Switching Devices"],"prefix":"10.1109","author":[{"given":"Xiaohan","family":"Wu","sequence":"first","affiliation":[]},{"given":"Ruijing","family":"Ge","sequence":"additional","affiliation":[]},{"given":"Deji","family":"Akinwande","sequence":"additional","affiliation":[]},{"given":"Jack C.","family":"Lee","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201504187"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201602391"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"434","DOI":"10.1021\/acs.nanolett.7b04342","volume":"18","author":"ge","year":"2018","journal-title":"Nano Lett"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201604811"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201806790"},{"key":"ref7","first-page":"9","author":"kim","year":"2018","journal-title":"Nat Commun"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41563-018-0234-y"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201203349"}],"event":{"name":"2020 Device Research Conference (DRC)","start":{"date-parts":[[2020,6,21]]},"location":"Columbus, OH, USA","end":{"date-parts":[[2020,6,24]]}},"container-title":["2020 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9132184\/9135142\/09135187.pdf?arnumber=9135187","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:58:01Z","timestamp":1656345481000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9135187\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/drc50226.2020.9135187","relation":{},"subject":[],"published":{"date-parts":[[2020,6]]}}}