{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T22:53:27Z","timestamp":1725576807131},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,6,20]],"date-time":"2021-06-20T00:00:00Z","timestamp":1624147200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,6,20]],"date-time":"2021-06-20T00:00:00Z","timestamp":1624147200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,6,20]],"date-time":"2021-06-20T00:00:00Z","timestamp":1624147200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,6,20]]},"DOI":"10.1109\/drc52342.2021.9467229","type":"proceedings-article","created":{"date-parts":[[2021,7,1]],"date-time":"2021-07-01T20:21:26Z","timestamp":1625170886000},"page":"1-2","source":"Crossref","is-referenced-by-count":0,"title":["Reduced Switching Current Density and Improved Interface Quality using Oxynitride Tunnel Barrier in Magnetic Tunnel Junctions for MRAM Application"],"prefix":"10.1109","author":[{"given":"Mohamad G.","family":"Moinuddin","sequence":"first","affiliation":[]},{"given":"Srikant","family":"Srinivasan","sequence":"additional","affiliation":[]},{"given":"Satinder K.","family":"Sharma","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-583X(01)01204-6"},{"journal-title":"US Patent-US 7 679 155 B2","year":"2010","author":"vladislav","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2954131"},{"journal-title":"US Patent-US009601 137B2","year":"2017","author":"zhang","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(74)90077-X"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1021\/acsaelm.9b00469"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-020-0461-5"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LMAG.2016.2539256"},{"journal-title":"IBM Research","year":"2016","author":"worledge","key":"ref1"}],"event":{"name":"2021 Device Research Conference (DRC)","start":{"date-parts":[[2021,6,20]]},"location":"Santa Barbara, CA, USA","end":{"date-parts":[[2021,6,23]]}},"container-title":["2021 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9467105\/9467107\/09467229.pdf?arnumber=9467229","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:43:12Z","timestamp":1652197392000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9467229\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,6,20]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/drc52342.2021.9467229","relation":{},"subject":[],"published":{"date-parts":[[2021,6,20]]}}}