{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:19:04Z","timestamp":1730215144118,"version":"3.28.0"},"reference-count":4,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,6,26]],"date-time":"2022-06-26T00:00:00Z","timestamp":1656201600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,6,26]],"date-time":"2022-06-26T00:00:00Z","timestamp":1656201600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,6,26]]},"DOI":"10.1109\/drc55272.2022.9855784","type":"proceedings-article","created":{"date-parts":[[2022,8,19]],"date-time":"2022-08-19T15:39:21Z","timestamp":1660923561000},"page":"1-2","source":"Crossref","is-referenced-by-count":1,"title":["Equivalent electrical circuit modelling of a TaO<sub>x<\/sub>\/HfO<sub>x<\/sub> based RRAM with optimized resistance window and multilevel states"],"prefix":"10.1109","author":[{"given":"T.","family":"Stecconi","sequence":"first","affiliation":[{"name":"IBM Research GmbH-Zurich Research Laboratory,R&#x00FC;schlikon,Switzerland,CH-8803"}]},{"given":"Y.","family":"Popoff","sequence":"additional","affiliation":[{"name":"ETH Zurich,Integrated Systems Laboratory,Zurich,Switzerland,CH-8092"}]},{"given":"R.","family":"Guido","sequence":"additional","affiliation":[{"name":"IBM Research GmbH-Zurich Research Laboratory,R&#x00FC;schlikon,Switzerland,CH-8803"}]},{"given":"M.","family":"Halter","sequence":"additional","affiliation":[{"name":"ETH Zurich,Integrated Systems Laboratory,Zurich,Switzerland,CH-8092"}]},{"given":"D.","family":"Falcone","sequence":"additional","affiliation":[{"name":"IBM Research GmbH-Zurich Research Laboratory,R&#x00FC;schlikon,Switzerland,CH-8803"}]},{"given":"A.","family":"La Porta","sequence":"additional","affiliation":[{"name":"IBM Research GmbH-Zurich Research Laboratory,R&#x00FC;schlikon,Switzerland,CH-8803"}]},{"given":"F.","family":"Horst","sequence":"additional","affiliation":[{"name":"IBM Research GmbH-Zurich Research Laboratory,R&#x00FC;schlikon,Switzerland,CH-8803"}]},{"given":"L.","family":"Begon-Lours","sequence":"additional","affiliation":[{"name":"IBM Research GmbH-Zurich Research Laboratory,R&#x00FC;schlikon,Switzerland,CH-8803"}]},{"given":"M.","family":"Sousa","sequence":"additional","affiliation":[{"name":"IBM Research GmbH-Zurich Research Laboratory,R&#x00FC;schlikon,Switzerland,CH-8803"}]},{"given":"B.J.","family":"Offrein","sequence":"additional","affiliation":[{"name":"IBM Research GmbH-Zurich Research Laboratory,R&#x00FC;schlikon,Switzerland,CH-8803"}]},{"given":"V.","family":"Bragaglia","sequence":"additional","affiliation":[{"name":"IBM Research GmbH-Zurich Research Laboratory,R&#x00FC;schlikon,Switzerland,CH-8803"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2719161"},{"key":"ref3","first-page":"6062901","volume":"104","author":"huang","year":"2014","journal-title":"Appl Phys Lett"},{"key":"ref2","first-page":"8.994","volume":"37","author":"woo","year":"2016","journal-title":"IEEE Electron Dev Lett"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1039\/C6NR03810G"}],"event":{"name":"2022 Device Research Conference (DRC)","start":{"date-parts":[[2022,6,26]]},"location":"Columbus, OH, USA","end":{"date-parts":[[2022,6,29]]}},"container-title":["2022 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9855770\/9855647\/09855784.pdf?arnumber=9855784","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,9,5]],"date-time":"2022-09-05T16:30:50Z","timestamp":1662395450000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9855784\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6,26]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/drc55272.2022.9855784","relation":{},"subject":[],"published":{"date-parts":[[2022,6,26]]}}}