{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,18]],"date-time":"2026-01-18T09:22:57Z","timestamp":1768728177686,"version":"3.49.0"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,6,26]],"date-time":"2022-06-26T00:00:00Z","timestamp":1656201600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,6,26]],"date-time":"2022-06-26T00:00:00Z","timestamp":1656201600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,6,26]]},"DOI":"10.1109\/drc55272.2022.9855803","type":"proceedings-article","created":{"date-parts":[[2022,8,19]],"date-time":"2022-08-19T15:39:21Z","timestamp":1660923561000},"page":"1-2","source":"Crossref","is-referenced-by-count":3,"title":["Impact of Corner Rounding on Quantum Confinement in GAA Nanosheet FETs for Advanced Technology Nodes"],"prefix":"10.1109","author":[{"given":"Anirban","family":"Kar","sequence":"first","affiliation":[{"name":"Indian Institute of Technology Kanpur,Kanpur,Uttar Pradesh,India,208016"}]},{"given":"Swapna","family":"Sarker","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology Roorkee,Roorkee,Uttarakhand,India,247667"}]},{"given":"Avirup","family":"Dasgupta","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology Roorkee,Roorkee,Uttarakhand,India,247667"}]},{"given":"Yogesh Singh","family":"Chauhan","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology Kanpur,Kanpur,Uttar Pradesh,India,208016"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2245419"},{"key":"ref3","first-page":"1","author":"baen","year":"2018","journal-title":"IEDM"},{"key":"ref6","first-page":"1","author":"yeung","year":"2018","journal-title":"IEDM"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2797687"},{"key":"ref8","author":"chauhan","year":"2015","journal-title":"Acad Press NY USA"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2960269"},{"key":"ref2","first-page":"1","author":"yeo","year":"2006","journal-title":"IEDM Tech Dig"},{"key":"ref1","first-page":"230","author":"loubet","year":"2017","journal-title":"Symposium on VLSI Tech"}],"event":{"name":"2022 Device Research Conference (DRC)","location":"Columbus, OH, USA","start":{"date-parts":[[2022,6,26]]},"end":{"date-parts":[[2022,6,29]]}},"container-title":["2022 Device Research Conference (DRC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9855770\/9855647\/09855803.pdf?arnumber=9855803","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,9,5]],"date-time":"2022-09-05T16:30:25Z","timestamp":1662395425000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9855803\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6,26]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/drc55272.2022.9855803","relation":{},"subject":[],"published":{"date-parts":[[2022,6,26]]}}}